| 2012 | 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012 |
| 2012 | A Software-Based Self-Test methodology for on-line testing of data TLBs. George Theodorou, Serafeim Chatzopoulos, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
| 2012 | A robust metric for screening outliers from analogue product manufacturing tests responses. Shaji Krishnan, Hans G. Kerkhoff |
| 2012 | Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information. Ender Yilmaz, Sule Ozev |
| 2012 | Adaptive testing of chips with varying distributions of unknown response bits. Chandra K. H. Suresh, Ozgur Sinanoglu, Sule Ozev |
| 2012 | Adaptive testing: Conquering process variations. Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell |
| 2012 | BIST design for analog cell matching. Cândido Duarte, Henrique Cavadas, Pedro Coke, Luis Malheiro, Vítor Grade Tavares, Pedro Guedes de Oliveira |
| 2012 | Bandwidth-aware test compression logic for SoC designs. Jakub Janicki, Jerzy Tyszer, Grzegorz Mrugalski, Janusz Rajski |
| 2012 | Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test. Alejandro Cook, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2012 | Characterization and handling of low-cost micro-architectural signatures in MPSoCs. Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiss, Andreas Genser, Holger Bock, Josef Haid |
| 2012 | Combining dynamic slicing and mutation operators for ESL correction. Urmas Repinski, Hanno Hantson, Maksim Jenihhin, Jaan Raik, Raimund Ubar, Giuseppe Di Guglielmo, Graziano Pravadelli, Franco Fummi |
| 2012 | Cost and power efficient timing error tolerance in flip-flop based microprocessor cores. Stefanos Valadimas, Yiorgos Tsiatouhas, Angela Arapoyanni |
| 2012 | Coupling-based resistive-open defects in TAS-MRAM architectures. Joao Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Guillaume Prenat, Jérémy Alvarez-Herault, Ken Mackay |
| 2012 | Defect analysis in power mode control logic of low-power SRAMs. Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine |
| 2012 | Dependable embedded systems: The German research foundation DFG priority program SPP 1500. Jörg Henkel, Oliver Bringmann, Andreas Herkersdorf, Wolfgang Rosenstiel, Norbert Wehn |
| 2012 | DfT support for launch and capture power reduction in launch-off-capture testing. Samah Mohamed Saeed, Ozgur Sinanoglu |
| 2012 | Diagnostic system based on support-vector machines for board-level functional diagnosis. Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty |
| 2012 | Disturbance fault testing on various NAND flash memories. Chih-Sheng Hou, Jin-Fu Li |
| 2012 | Efficient system-level aging prediction. Nadereh Hatami, Rafal Baranowski, Paolo Prinetto, Hans-Joachim Wunderlich |
| 2012 | Embedded synthetic instruments for Board-Level testing. Artur Jutman, Sergei Devadze, Igor Aleksejev, Thomas Wenzel |
| 2012 | Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs. Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet, Christophe Forel |
| 2012 | Enhanced wafer matching heuristics for 3-D ICs. Vasilis F. Pavlidis, Hu Xu, Giovanni De Micheli |
| 2012 | Exact stuck-at fault classification in presence of unknowns. Stefan Hillebrecht, Michael A. Kochte, Hans-Joachim Wunderlich, Bernd Becker |
| 2012 | FP7 collaborative research project DIAMOND: Diagnosis, error modeling and correction for reliable systems design. Jaan Raik |
| 2012 | Fast error detection through efficient use of hardwired resources in FPGAs. Gabriel L. Nazar, Luigi Carro |
| 2012 | Fault tolerant FPGA processor based on runtime reconfigurable modules. Mihalis Psarakis, Andreas Apostolakis |
| 2012 | Fault-Tolerant Algebraic Architecture for radiation induced soft-errors. Fábio P. Itturriet, Ronaldo Rodrigues Ferreira, Luigi Carro |
| 2012 | Functional analysis of circuits under timing variations. Mehdi Dehbashi, Görschwin Fey, Kaushik Roy, Anand Raghunathan |
| 2012 | Functional test generation for hard to detect stuck-at faults using RTL model checking. Mahesh Prabhu, Jacob A. Abraham |
| 2012 | Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles. Piet Engelke, Hermann Obermeir |
| 2012 | Impact of NBTI on analog components. Zhengliang Lv, Linda Milor, Shiyuan Yang |
| 2012 | Increasing autonomous fault-tolerant FPGA-based systems' lifetime. Cristiana Bolchini, Antonio Miele, Chiara Sandionigi |
| 2012 | Indirect method for random jitter measurement on SoCs using critical path characterization. Jae Wook Lee, Ji Hwan (Paul) Chun, Jacob A. Abraham |
| 2012 | Introducing MEDIAN: A new COST Action on manufacturable and dependable multicore architectures at nanoscale. Marco Ottavi |
| 2012 | Introduction to the defect-oriented cell-aware test methodology for significant reduction of DPPM rates. Friedrich Hapke, Jürgen Schlöffel |
| 2012 | Memory reliability improvements based on maximized error-correcting codes. Valentin Gherman, Samuel Evain, Yannick Bonhomme |
| 2012 | Multi-conditional SAT-ATPG for power-droop testing. Alexander Czutro, Matthias Sauer, Ilia Polian, Bernd Becker |
| 2012 | Multi-voltage aware resistive open fault modeling. Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin |
| 2012 | OBT for settling error test of sampled-data systems using signal-dependent clocking. Manuel J. Barragan Asian, Gildas Léger, José L. Huertas |
| 2012 | On the detection of path delay faults by functional broadside tests. Irith Pomeranz |
| 2012 | On the quality of test vectors for post-silicon characterization. Matthias Sauer, Alexander Czutro, Bernd Becker, Ilia Polian |
| 2012 | On-chip delay measurement circuit. Abhishek Jain, Andrea Veggetti, Dennis Crippa, Pierluigi Rolandi |
| 2012 | On-chip temperature and voltage measurement for field testing. Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara |
| 2012 | On-chip test comparison for protecting confidential data in secure ICs. Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre |
| 2012 | On-line software-based self-test of the Address Calculation Unit in RISC processors. Paolo Bernardi, Lyl M. Ciganda, Mauricio de Carvalho, Michelangelo Grosso, Jorge Luis Lagos-Benites, Ernesto Sánchez, Matteo Sonza Reorda, Oscar Ballan |
| 2012 | Online detection and recovery of transient errors in front-end structures of microprocessors. Syed Zafar Shazli, Mehdi Baradaran Tahoori |
| 2012 | Power-aware testing: The next stage. Xiaoqing Wen |
| 2012 | Re-using chip level DFT at board level. Xinli Gu, Jeff Rearick, Bill Eklow, Martin Keim, Jun Qian, Artur Jutman, Krishnendu Chakrabarty, Erik Larsson |
| 2012 | Reducing test cost for mixed signal circuits "From TOETS to ELESIS". Mohamed Azimane |
| 2012 | Reducing wearout in embedded processors using proactive fine-grain dynamic runtime adaptation. Fabian Oboril, Mehdi Baradaran Tahoori |
| 2012 | Test tool qualification through fault injection. Q. Wang, Andreas Wallin, Viacheslav Izosimov, Urban Ingelsson, Zebo Peng |
| 2012 | Testing of digitally assisted adaptive analog/RF systems using tuning knob - Performance space estimation. Aritra Banerjee, Shyam Kumar Devarakond, Shreyas Sen, Debashis Banerjee, Abhijit Chatterjee |
| 2012 | The impact of functional safety standards in the design and test of reliable and available integrated circuits. Riccardo Mariani |
| 2012 | Through-Silicon-Via resistive-open defect analysis. Carolina Metzler, Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel |
| 2012 | Time-division multiplexing for testing SoCs with DVS and multiple voltage islands. Xrysovalantis Kavousianos, Krishnendu Chakrabarty, Arvind Jain, Rubin A. Parekhji |
| 2012 | Toggle-masking scheme for x-filtering. Abishek Ramdas, Ozgur Sinanoglu |
| 2012 | VLSI Test technology: Why is the field not sexy enough? Said Hamdioui, Rob Aitken |