| 2009 | 14th IEEE European Test Symposium, ETS 2009, Sevilla, Spain, May 25-29, 2009 |
| 2009 | A Two Phase Approach for Minimal Diagnostic Test Set Generation. Mohammed Ashfaq Shukoor, Vishwani D. Agrawal |
| 2009 | A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. Josep Rius, Luis Elvira Villagra, Maurice Meijer |
| 2009 | Algorithms for ADC Multi-site Test with Digital Input Stimulus. Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud |
| 2009 | Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Sánchez, Matteo Sonza Reorda |
| 2009 | Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems. Qais Al-Gayem, Hongyuan Liu, Andrew Richardson, Nick Burd |
| 2009 | Categorizing and Analysis of Activated Faults in the FlexRay Communication Controller Registers. Yasser Sedaghat, Seyed Ghassem Miremadi |
| 2009 | Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead. Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich |
| 2009 | Critical Path Selection for Delay Test Considering Coupling Noise. Rajeshwary Tayade, Jacob A. Abraham |
| 2009 | Defect Filter for Alternate RF Test. Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev |
| 2009 | Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections. Olivier Ginez, Jean-Michel Portal, Christophe Muller |
| 2009 | Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment. Frank-Uwe Faber, Matthias Beck, Markus Rudack, Olivier Barondeau, Thomas Rabenalt, Michael Gössel, Andreas Leininger |
| 2009 | Exploiting Thread-Level Parallelism in Functional Self-Testing of CMT Processors. Andreas Apostolakis, Mihalis Psarakis, Dimitris Gizopoulos, Antonis M. Paschalis, Ishwar Parulkar |
| 2009 | Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques. Stephan Eggersglüß, Rolf Drechsler |
| 2009 | Input Cubes with Lingering Synchronization Effects and their Use in Random Sequential Test Generation. Irith Pomeranz, Sudhakar M. Reddy |
| 2009 | Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh |
| 2009 | Masking of X-values by Use of a Hierarchically Configurable Register. Thomas Rabenalt, Michael Gössel, Andreas Leininger |
| 2009 | Novel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications. Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner |
| 2009 | On Minimization of Peak Power for Scan Circuit during Test. Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Vishwani D. Agrawal |
| 2009 | Partial Scan Approach for Secret Information Protection. Michiko Inoue, Tomokazu Yoneda, Muneo Hasegawa, Hideo Fujiwara |
| 2009 | Resource-Efficient Programmable Trigger Units for Post-Silicon Validation. Ho Fai Ko, Nicola Nicolici |
| 2009 | Signature-Based Testing for Digitally-Assisted Adaptive Equalizers in High-Speed Serial Links. Mohamed Abbas, Kwang-Ting Cheng, Yasuo Furukawa, Satoshi Komatsu, Kunihiro Asada |
| 2009 | Something I Always Wanted to Know About Test, But Was Afraid to Ask. Christian Landrault |
| 2009 | Speed-Path Debug Using At-Speed Scan Test Patterns. Ruifeng Guo, Wu-Tung Cheng, Kun-Han Tsai |
| 2009 | Test Encoding for Extreme Response Compaction. Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich |
| 2009 | Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin |
| 2009 | We Have Got Compression, What Next? Janusz Rajski |