| 2008 | 13th European Test Symposium, ETS 2008, Verbania, Italy, May 25-29, 2008 |
| 2008 | A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja |
| 2008 | A Reliable Architecture for the Advanced Encryption Standard. Giorgio Di Natale, M. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre |
| 2008 | A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker |
| 2008 | Accelerated Shift Registers for X-tolerant Test Data Compaction. Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel |
| 2008 | Adaptive Debug and Diagnosis without Fault Dictionaries. Stefan Holst, Hans-Joachim Wunderlich |
| 2008 | An Improved Algorithm to Identify the Test Stimulus in Histogram-Based A/D Converter Testing. Esa Korhonen, Juha Kostamovaara |
| 2008 | An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso |
| 2008 | Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong |
| 2008 | Applying March Tests to K-Way Set-Associative Cache Memories. Simone Alpe, Stefano Di Carlo, Paolo Prinetto, Alessandro Savino |
| 2008 | Bandwidth Analysis for Reusing Functional Interconnect as Test Access Mechanism. Ardy van den Berg, Pengwei Ren, Erik Jan Marinissen, Georgi Gaydadjiev, Kees Goossens |
| 2008 | Bridge Defect Diagnosis for Multiple-Voltage Design. S. Saqib Khursheed, Paul M. Rosinger, Bashir M. Al-Hashimi, Sudhakar M. Reddy, Peter Harrod |
| 2008 | Built-in Test of Frequency Modulated RF Transmitters Using Embedded Low-Pass Filters. Rajarajan Senguttuvan, Hyun Woo Choi, Donghoon Han, Abhijit Chatterjee |
| 2008 | Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction. Nathan Kupp, Petros Drineas, Mustapha Slamani, Yiorgos Makris |
| 2008 | Convolutional Coding for SEU mitigation. Laura Frigerio, Matteo Alan Radaelli, Fabio Salice |
| 2008 | Critical Path Selection for Delay Test Considering Coupling Noise. Rajeshwary Tayade, Jacob A. Abraham |
| 2008 | Diagnose Multiple Stuck-at Scan Chain Faults. Yu Huang, Wu-Tung Cheng, Ruifeng Guo |
| 2008 | Function-Inherent Code Checking: A New Low Cost On-Line Testing Approach for High Performance Microprocessor Control Logic. Cecilia Metra, Daniele Rossi, Martin Omaña, Abhijit Jas, Rajesh Galivanche |
| 2008 | Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories. Benoît Godard, Jean Michel Daga, Lionel Torres, Gilles Sassatelli |
| 2008 | Jitter Decomposition in High-Speed Communication Systems. Qingqi Dou, Jacob A. Abraham |
| 2008 | Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns. Seongmoon Wang, Wenlong Wei |
| 2008 | On Bypassing Blocking Bugs during Post-Silicon Validation. Ehab Anis Daoud, Nicola Nicolici |
| 2008 | Risks for Signal Integrity in System in Package and Possible Remedies. Daniele Rossi, Paolo Angelini, Cecilia Metra, Giovanni Campardo, Gian Pietro Vanalli |
| 2008 | Safe Fault Collapsing Based on Dominance Relations. Irith Pomeranz, Sudhakar M. Reddy |
| 2008 | Selective Hardening in Early Design Steps. Christian G. Zoellin, Hans-Joachim Wunderlich, Ilia Polian, Bernd Becker |
| 2008 | Self-Programmable Shared BIST for Testing Multiple Memories. Swapnil Bahl, Vishal Srivastava |
| 2008 | Temporally Extended High-Level Decision Diagrams for PSL Assertions Simulation. Maksim Jenihhin, Jaan Raik, Anton Chepurov, Raimund Ubar |
| 2008 | The Future Is Low Power and Test. Thomas W. Williams |
| 2008 | The Role of Test in Circuits Built with Unreliable Components. Antonio Rubio |
| 2008 | Tunable Transient Filters for Soft Error Rate Reduction in Combinational Circuits. Quming Zhou, Mihir R. Choudhury, Kartik Mohanram |
| 2008 | Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers. Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire |