| 2007 | "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell |
| 2007 | 12th European Test Symposium, ETS 2007, Freiburg, Germany, May 20, 2007 |
| 2007 | A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. Erik Schüler, Marcelo Negreiros, Pascal Nouet, Luigi Carro |
| 2007 | A Novel Approach for Online Sensor Testing Based on an Encoded Test Stimulus. Norbert Dumas, Zhou Xu, Kostas Georgopoulos, R. John T. Bunyan, Andrew Richardson |
| 2007 | A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression. Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek |
| 2007 | Adaptive Debug and Diagnosis without Fault Dictionaries. Stefan Holst, Hans-Joachim Wunderlich |
| 2007 | An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich |
| 2007 | Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware |
| 2007 | Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. Sankar Gurumurthy, Ramtilak Vemu, Jacob A. Abraham, Daniel G. Saab |
| 2007 | Communication-Centric SoC Debug Using Transactions. Bart Vermeulen, Kees Goossens, Remco van Steeden, Martijn T. Bennebroek |
| 2007 | Computation and Application of Absolute Dominators in Industrial Designs. Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel |
| 2007 | DERRIC: A Tool for Unified Logic Diagnosis. Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | Diagnostic Test Generation Based on Subsets of Faults. Irith Pomeranz, Sudhakar M. Reddy |
| 2007 | Digital Generation of Signals for Low Cost RF BIST. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin |
| 2007 | Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian |
| 2007 | Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel |
| 2007 | Electronics Design-for-Test: Past, Present and Future. Ben Bennetts |
| 2007 | Embedded Tutorial on Low Power Test. Nicola Nicolici, Xiaoqing Wen |
| 2007 | Embedded Tutorial: IC Test Cost Benchmarking. Klaus Luther |
| 2007 | FPGA Architecture for RF Transceiver System and Mixed-Signal Low Cost Tests. Ivo Koren, Frank Demmerle, Roland May, Martin Kaibel, Sebastian Sattler |
| 2007 | If It's All about Yield, Why Talk about Testing? Rene Segers |
| 2007 | On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores. Paolo Bernardi, Michelangelo Grosso, Ernesto Sánchez, Matteo Sonza Reorda |
| 2007 | Optimal Contexts for the Self-Test of Coarse Grain Dynamically Reconfigurable Processors. Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara |
| 2007 | Optimization of NoC Wrapper Design under Bandwidth and Test Time Constraints. Fawnizu Azmadi Hussin, Tomokazu Yoneda, Hideo Fujiwara |
| 2007 | PPM Reduction on Embedded Memories in System on Chip. Said Hamdioui, Zaid Al-Ars, Javier Jiménez, Jose Calero |
| 2007 | Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips. Tao Xu, Krishnendu Chakrabarty |
| 2007 | Purely Digital BIST for Any PLL or DLL. Stephen K. Sunter, Aubin Roy |
| 2007 | Selecting Power-Optimal SBST Routines for On-Line Processor Testing. Andreas Merentitis, Nektarios Kranitis, Antonis M. Paschalis, Dimitris Gizopoulos |
| 2007 | Static and Dynamic Analysis of SEU Effects in SRAM-Based FPGAs. Luca Sterpone, Massimo Violante |
| 2007 | System Level Approaches for Mitigation of Long Duration Transient Faults in Future Technologies. Carlos Arthur Lang Lisbôa, Marcelo Ienczczak Erigson, Luigi Carro |
| 2007 | System-in-Package, a Combination of Challenges and Solutions. Philippe Cauvet, Serge Bernard, Michel Renovell |
| 2007 | Test Configurations for Diagnosing Faulty Links in NoC Switches. Jaan Raik, Raimund Ubar, Vineeth Govind |
| 2007 | Ultra Fast Parallel Fault Analysis on Structurally Synthesized BDDs. Raimund Ubar, Sergei Devadze, Jaan Raik, Artur Jutman |
| 2007 | Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives. Shaji Krishnan, Rene Jonker, Leon van de Logt |
| 2007 | Wafer Level Reliability Screens. Peter C. Maxwell |