| 2006 | "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC. Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell |
| 2006 | 11th European Test Symposium, ETS 2006, Southhampton, UK, May 21-24, 2006 |
| 2006 | A 22n March Test for Realistic Static Linked Faults in SRAMs. Alfredo Benso, Alberto Bosio, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto |
| 2006 | A DFT Architecture for Asynchronous Networks-on-Chip. Xuan-Tu Tran, Jean Durupt, François Bertrand, Vincent Beroulle, Chantal Robach |
| 2006 | A Flexible and Scaleable Methodology for Testing High Speed Source Synchronous Interfaces on ATE with Multiple Fixed Phase Capture and Compare. Bernd Laquai, Martin Hua, Guido Schulze, Michael Braun |
| 2006 | A Low Cost Alternative Method for Harmonics Estimation in a BIST Context. Vincent Fresnaud, Lilian Bossuet, Dominique Dallet, Serge Bernard, Jean-Marie Janik, B. Agnus, Philippe Cauvet, Ph. Gandy |
| 2006 | A Robust 130nm-CMOS Built-In Current Sensor Dedicated to RF Applications. Mikaël Cimino, Hervé Lapuyade, M. De Matos, Thierry Taris, Yann Deval, Jean-Baptiste Bégueret |
| 2006 | A Transparent based Programmable Memory BIST. Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa |
| 2006 | A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz |
| 2006 | Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices. Kentaroh Katoh, Hideo Ito |
| 2006 | Convolutional Compactors with Variable Polynomials. Artur Pogiel, Janusz Rajski, Jerzy Tyszer |
| 2006 | Deterministic Logic BIST for Transition Fault Testing. Valentin Gherman, Hans-Joachim Wunderlich, Jürgen Schlöffel, Michael Garbers |
| 2006 | Dynamic Voltage Scaling Aware Delay Fault Testing. Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M. Al-Hashimi, Peter Harrod |
| 2006 | Enhancing Delay Fault Coverage through Low Power Segmented Scan. Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi |
| 2006 | Evaluating Sigma-Delta Modulated Signals to Develop Fault-Tolerant Circuits. Erik Schüler, Daniel Scain Farenzena, Luigi Carro |
| 2006 | Experimental Validation of a Fully Digital BISTfor Cascaded Sigma Delta Modulators. Gildas Léger, Adoración Rueda |
| 2006 | FATE: a Functional ATPG to Traverse Unstabilized EFSMs. Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli |
| 2006 | Fault Collapsing for Transition Faults Using Extended Transition Faults. Irith Pomeranz, Sudhakar M. Reddy |
| 2006 | Fault Identification in Reconfigurable Carry Lookahead Adders Targeting Nanoelectronic Fabrics. Wenjing Rao, Alex Orailoglu, Ramesh Karri |
| 2006 | Fault Injection-based Reliability Evaluation of SoPCs. Matteo Sonza Reorda, Luca Sterpone, Massimo Violante, Marta Portela-García, Celia López-Ongil, Luis Entrena |
| 2006 | Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study. Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | Innovation and Wealth Creation from Technology. Robin Saxby |
| 2006 | Living with Failure: Lessons from Nature? Steve B. Furber |
| 2006 | Low Cost Launch-on-Shift Delay Test with Slow Scan Enable. Gefu Xu, Adit D. Singh |
| 2006 | Low Cost Parametric Failure Diagnosis of RF Transceivers. Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee |
| 2006 | Low-Cost Online Testing of Asynchronous Handshakes. Delong Shang, Alexandre Yakovlev, Frank P. Burns, Fei Xia, Alexandre V. Bystrov |
| 2006 | Minimal March Tests for Dynamic Faults in Random Access Memories. Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian |
| 2006 | New Techniques for Accessing Embedded Instrumentation: IEEE P1687 (IJTAG). Bill Eklow, Ben Bennetts |
| 2006 | On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture. Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz |
| 2006 | On-Chip Test Generation Using Linear Subspaces. Ramashis Das, Igor L. Markov, John P. Hayes |
| 2006 | On-Chip Time Measurement Architecture with Femtosecond Timing Resolution. Matthew Collins, Bashir M. Al-Hashimi |
| 2006 | Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. Byoungho Kim, Hongjoong Shin, Ji Hwan (Paul) Chun, Jacob A. Abraham |
| 2006 | Reducing Sampling Clock Jitter to Improve SNR Measurement of A/D Converters in Production Test. Shalabh Goyal, Abhijit Chatterjee, Mike Atia |
| 2006 | Retention-Aware Test Scheduling for BISTed Embedded SRAMs. Qiang Xu, Baosheng Wang, F. Y. Young |
| 2006 | Single-Event Upset Analysis and Protection in High Speed Circuits. Mohammad Hosseinabady, Pejman Lotfi-Kamran, Giorgio Di Natale, Stefano Di Carlo, Alfredo Benso, Paolo Prinetto |
| 2006 | Soft-Error Rate Testing of Deep-Submicron Integrated Circuits. Tino Heijmen, André Nieuwland |
| 2006 | Test-per-Clock Detection, Localization and Identification of Interconnect Faults. Michal Kopec, Tomasz Garbolino, Krzysztof Gucwa, Andrzej Hlawiczka |
| 2006 | Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories. Yu-Jen Huang, Jin-Fu Li |
| 2006 | Testing and Diagnosis of Power Switches in SOCs. Sandeep Kumar Goel, Maurice Meijer, José Pineda de Gyvez |
| 2006 | Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism. Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes |