| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
DCIS
|
| 2021 | — | conf |
DCIS
|
| 2021 | J | jnl |
Sensors
|
| 2021 | — | conf |
DCIS
|
| 2020 | J | jnl |
Sensors
|
| 2020 | — | conf |
ICIT
|
| 2020 | J | jnl |
Sensors
|
| 2020 | J | jnl |
Indirect and adaptive test of analogue circuits based on preselected steady-state response measures.
IET Circuits Devices Syst.
|
| 2020 | J | jnl |
Sensors
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2016 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | J | jnl |
Integr.
|
| 2015 | — | conf |
DTIS
|
| 2014 | B | conf |
ETS
|
| 2014 | — | conf |
ATS
|
| 2014 | B | conf |
ETS
|
| 2014 | C | conf |
IOLTS
|
| 2014 | J | jnl |
Microelectron. J.
|
| 2013 | B | conf |
ETS
|
| 2011 | — | conf |
Asian Test Symposium
|