| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
Deep digital twin-powered large vision-language model for multi-scenario industrial fault diagnosis.
Adv. Eng. Informatics
|
| 2026 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2026 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2026 | J | jnl |
Comput. Ind. Eng.
|
| 2025 | J | jnl |
Adv. Eng. Informatics
|
| 2025 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
Appl. Soft Comput.
|
| 2024 | J | jnl |
IEEE Internet Things J.
|
| 2023 | J | jnl |
Inf. Fusion
|
| 2023 | J | jnl |
Inf. Fusion
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2023 | J | jnl |
Expert Syst. Appl.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
Expert Syst. Appl.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|