| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
DSIT
|
| 2021 | J | jnl |
Comput. Electron. Agric.
|
| 2021 | J | jnl |
Int. J. Autom. Comput.
|
| 2021 | J | jnl |
Neural Comput. Appl.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
Representation learning via a semi-supervised stacked distance autoencoder for image classification.
Frontiers Inf. Technol. Electron. Eng.
|
| 2020 | J | jnl |
Comput. Electron. Agric.
|
| 2019 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2019 | J | jnl |
Comput. Electron. Agric.
|
| 2019 | J | jnl |
Comput. Electron. Agric.
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Cogn. Comput.
|
| 2017 | J | jnl |
Cogn. Comput.
|
| 2016 | J | jnl |
Algorithms
|
| 2014 | — | conf |
ICIA
|