| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | — | conf |
AIiH (1)
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2023 | J | jnl |
Biomed. Signal Process. Control.
|
| 2023 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2023 | J | jnl |
Sensor Data Modeling and Model Frequency Analysis for Detecting Cutting Tool Anomalies in Machining.
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
Pattern Recognit.
|
| 2022 | C | conf |
ICARCV
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Autom.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2018 | J | jnl |
Autom.
|
| 2018 | J | jnl |
Autom.
|
| 2017 | — | conf |
AIM
|
| 2016 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2012 | J | jnl |
Int. J. Comput. Appl. Technol.
|
| 2011 | J | jnl |
CoRR
|
| 2011 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2010 | — | conf |
LSMS/ICSEE (1)
|
| 2009 | — | conf |
ECC
|
| 1997 | J | jnl |
IEEE Trans. Autom. Control.
|
| 1994 | J | jnl |
IEEE Trans. Autom. Control.
|
| 1993 | J | jnl |
Autom.
|