| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Reliab.
|
| 2023 | J | jnl |
Empir. Softw. Eng.
|
| 2023 | J | jnl |
Sci. Comput. Program.
|
| 2023 | J | jnl |
Inf. Softw. Technol.
|
| 2023 | A | conf |
SANER
|
| 2023 | J | jnl |
IEEE Trans. Reliab.
|
| 2023 | J | jnl |
World Wide Web (WWW)
|
| 2023 | J | jnl |
IET Softw.
|
| 2023 | J | jnl |
Empir. Softw. Eng.
|
| 2022 | A | conf |
ISSRE
|
| 2022 | J | jnl |
IET Softw.
|
| 2022 | J | jnl |
IET Softw.
|
| 2022 | A | conf |
SANER
|
| 2022 | J | jnl |
IEEE Geosci. Remote. Sens. Lett.
|
| 2022 | J | jnl |
IEEE Trans. Reliab.
|
| 2022 | J | jnl |
J. Syst. Softw.
|
| 2022 | J | jnl |
IEEE Trans. Reliab.
|
| 2022 | A | conf |
SANER
|
| 2022 | A | conf |
ISSTA
|
| 2022 | J | jnl |
J. Syst. Softw.
|
| 2022 | J | jnl |
IEEE Trans. Software Eng.
|
| 2021 | J | jnl |
J. Syst. Softw.
|
| 2021 | J | jnl |
Inf. Softw. Technol.
|
| 2021 | A | conf |
ISSRE
|
| 2021 | C | conf |
QRS
|
| 2021 | J | jnl |
IEEE Trans. Reliab.
|
| 2021 | J | jnl |
Inf. Softw. Technol.
|
| 2021 | Misc | conf |
SAC
|
| 2021 | A | conf |
ICPC
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
IEEE Trans. Reliab.
|
| 2021 | A | conf |
SANER
|
| 2020 | — | conf |
ESEC/SIGSOFT FSE
|
| 2020 | B | conf |
COMPSAC
|
| 2020 | J | jnl |
J. Syst. Softw.
|
| 2020 | A | conf |
ISSRE
|
| 2020 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Neurocomputing
|
| 2020 | J | jnl |
J. Syst. Softw.
|
| 2020 | A | conf |
ICSME
|
| 2020 | J | jnl |
IEEE Trans. Reliab.
|
| 2020 | — | conf |
QRS Companion
|
| 2020 | J | jnl |
IEEE Trans. Image Process.
|
| 2020 | C | conf |
QRS
|
| 2020 | J | jnl |
CoRR
|
| 2020 | C | conf |
QRS
|
| 2019 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2019 | A | conf |
SANER
|
| 2019 | J | jnl |
J. Comput. Sci. Technol.
|
| 2019 | A* | conf |
ASE
|
| 2019 | A | conf |
ISSRE
|
| 2019 | J | jnl |
J. Syst. Softw.
|
| 2019 | J | jnl |
IET Softw.
|
| 2019 | C | conf |
QRS
|
| 2019 | J | jnl |
Inf. Softw. Technol.
|
| 2019 | J | jnl |
J. Syst. Softw.
|
| 2019 | J | jnl |
Int. J. Pattern Recognit. Artif. Intell.
|
| 2018 | A | conf |
ICPC
|
| 2018 | A | conf |
Cross-version defect prediction via hybrid active learning with kernel principal component analysis.
SANER
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | C | conf |
SEKE
|
| 2016 | C | conf |
SEKE
|
| 2016 | A | conf |
SANER
|
| 2016 | A | conf |
ISSRE
|