| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IFAC J. Syst. Control.
|
| 2026 | J | jnl |
J. Ind. Inf. Integr.
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Cybern.
|
| 2025 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2025 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2025 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2025 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2025 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Cybern.
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2024 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2024 | J | jnl |
IEEE Trans. Knowl. Data Eng.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Reliab.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
IEEE CAA J. Autom. Sinica
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Causal variable selection for industrial process quality prediction via attention-based GRU network.
Eng. Appl. Artif. Intell.
|
| 2023 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
IEEE Trans. Cybern.
|
| 2023 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IFAC J. Syst. Control.
|
| 2022 | J | jnl |
IEEE Trans. Cybern.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Annu. Rev. Control.
|
| 2022 | J | jnl |
Comput. Vis. Image Underst.
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2022 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
Auxiliary Information-Guided Industrial Data Augmentation for Any-Shot Fault Learning and Diagnosis.
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2021 | J | jnl |
IFAC J. Syst. Control.
|
| 2021 | J | jnl |
IEEE Trans. Cybern.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2020 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2020 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2020 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
Multi-rate principal component regression model for soft sensor application in industrial processes.
Sci. China Inf. Sci.
|
| 2020 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2019 | — | conf |
ASCC
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | — | conf |
CAA SAFEPROCESS
|
| 2019 | J | jnl |
IFAC J. Syst. Control.
|
| 2019 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2019 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2019 | — | conf |
CAA SAFEPROCESS
|
| 2019 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | — | conf |
ASCC
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | J | jnl |
IFAC J. Syst. Control.
|
| 2019 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2019 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IFAC J. Syst. Control.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
Annu. Rev. Control.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2017 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2017 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2017 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2017 | — | conf |
IGTA
|
| 2017 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2017 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2017 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2016 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2016 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2016 | J | jnl |
IEEE Trans. Control. Syst. Technol.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | C | conf |
ACC
|
| 2012 | C | conf |
ACC
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Comput. Chem. Eng.
|
| 2010 | — | conf |
CDC
|
| 2010 | C | conf |
ACC
|
| 2009 | — | conf |
CDC
|
| 2006 | — | conf |
ICICIC (1)
|