| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Commun. Surv. Tutorials
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Wirel. Commun. Lett.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Wirel. Commun.
|
| 2024 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Concurr. Comput. Pract. Exp.
|
| 2023 | J | jnl |
IEEE Trans. Cybern.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2022 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Appl. Artif. Intell.
|
| 2022 | J | jnl |
J. Real Time Image Process.
|
| 2021 | — | conf |
AHFE (17)
|
| 2021 | — | conf |
AHFE (17)
|
| 2020 | — | conf |
HCI (10)
|
| 2020 | — | conf |
AHFE (17)
|
| 2019 | C | conf |
PDCAT
|
| 2019 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2019 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
J. Electronic Imaging
|
| 2018 | — | conf |
IHSI
|
| 2018 | J | jnl |
Expert Syst. Appl.
|
| 2017 | — | conf |
AHFE (7)
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Access
|
| 2016 | — | conf |
I2MTC
|
| 2016 | J | jnl |
Commun. Nonlinear Sci. Numer. Simul.
|
| 2016 | — | conf |
ICPHM
|
| 2016 | — | conf |
I2MTC
|
| 2015 | — | conf |
I2MTC
|
| 2011 | J | jnl |
IEEE Trans. Reliab.
|
| 2004 | — | conf |
ISNN (2)
|