| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
A highly robust shallow snapback dual direction SCR for industry-level RS485 on-chip ESD protection.
Microelectron. J.
|
| 2026 | J | jnl |
Microelectron. J.
|
| 2026 | J | jnl |
Sci. China Inf. Sci.
|
| 2025 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2025 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | C | conf |
ISCAS
|
| 2025 | — | conf |
MLCAD
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
IEEE J. Solid State Circuits
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | J | jnl |
IEICE Electron. Express
|
| 2023 | — | conf |
ISSCC
|
| 2021 | J | jnl |
IEICE Electron. Express
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2021 | — | conf |
ITC-Asia
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2020 | — | conf |
ATS
|
| 2020 | J | jnl |
Microelectron. J.
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2019 | — | conf |
ITC-Asia
|
| 2019 | C | conf |
ISCAS
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | — | conf |
ASICON
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2015 | J | jnl |
IEICE Electron. Express
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2014 | J | jnl |
IEICE Electron. Express
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2012 | J | jnl |
IEICE Electron. Express
|
| 2009 | J | jnl |
IEICE Trans. Electron.
|