Zhihong Mai

13 papers C 1Journal 11Unranked 1
YearRankTypeTitle / Venue / Authors
2021 — conf
An intelligent Cable Detection System in Shallow Water Area.
AIAM (ACM)
Zhihong Mai, Quanzhong Zhao, Zheng Liu, Weisheng Hou, Liang Zeng
2018 C conf
Change Detection in Optical Remote Sensing Images with a Fully Object-Level Approach.
IGARSS
Long Ma, Zhihong Mai, He Chen, Wenchao Liu, Fan Feng, Guichi Liu, Nouman Qadeer Soomro
2018 J jnl
Cross-sectional nanoprobing sample preparation on sub-micron device with fast laser grooving technique.
Microelectron. Reliab.
Pik Kee Tan, Yuzhe Zhao, Francis Rivai, Binghai Liu, Yanlin Pan, Ran He, Hao Tan, Zhihong Mai
2018 J jnl
Failure analysis on 14 nm FinFET devices with ESD CDM failure.
Microelectron. Reliab.
Shaalini Chithambaram, Pik Kee Tan, Yuzhe Zhao, Binghai Liu, Yinzhe Ma, Alfred Quah, Dayanand Nagalingam, Yanlin Pan, Zhihong Mai
2017 J jnl
Application of Scanning Capacitance Microscopy on SOI device with wafer edge low yield pattern.
Microelectron. Reliab.
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Soh Ping Neo, Dayanand Nagalingam, Kim Hong Yip, Jeffery Lam, Zhihong Mai
2017 J jnl
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis.
Microelectron. Reliab.
Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Hui Peng Ng, Alfred C. T. Quah, Angela Teo, Jeffery Lam, Zhihong Mai
2017 J jnl
Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect.
Microelectron. Reliab.
Soh Ping Neo, Alfred C. T. Quah, Ghim Boon Ang, Dayanand Nagalingam, Hnin Hnin Ma, Siong Luong Ting, C. W. Soo, Changqing Chen, Zhihong Mai, Jeffrey Lam
2017 J jnl
In-depth circuits edit analysis to reveal the implantation-related defect.
Microelectron. J.
Changqing Chen, Ghim Boon Ang, Jeffrey Lam, Zhihong Mai
2017 J jnl
Static fault localization of subtle metallization defects using near infrared photon emission microscopy.
Microelectron. Reliab.
Alfred C. T. Quah, Dayanand Nagalingam, Seung Je Moon, Edy Susanto, Ghim Boon Ang, Soh Ping Neo, Jeffrey Lam, Zhihong Mai
2016 J jnl
Application of Fast Laser Deprocessing Techniques on large cross-sectional view area sample with FIB-SEM dual beam system.
Microelectron. Reliab.
Yuzhe Zhao, Q. J. Wang, Pik Kee Tan, Huei Hao Yap, Binghai Liu, H. Feng, Hao Tan, Ran He, Y. M. Huang, D. D. Wang, Lei Zhu, C. Q. Chen, Francis Rivai, Jeffrey Lam, Zhihong Mai
2016 J jnl
Application of laser deprocessing technique in PFA on chemical over-etched on bond-pad issue.
Microelectron. Reliab.
Huei Hao Yap, Pik Kee Tan, Lei Zhu, H. Feng, Yuzhe Zhao, Ran He, Hao Tan, B. Liu, Y. M. Huang, D. D. Wang, Jeffrey Lam, Zhihong Mai
2016 J jnl
Electrical analysis on implantation-related defect by nanoprobing methodology.
Microelectron. Reliab.
Changqing Chen, P. T. Ng, Ghinboon Ang, H. Tan, Francis Rivai, Y. Z. Ma, Huipeng Ng, Jeffrey Lam, Zhihong Mai
2015 J jnl
Top-down delayering to expose large inspection area on die side-edge with Platinum (Pt) deposition technique.
Microelectron. Reliab.
Huei Hao Yap, Pik Kee Tan, G. R. Low, M. K. Dawood, Hua Feng, Yuzhe Zhao, Ran He, Hao Tan, J. Zhu, Binghai Liu, Y. M. Huang, D. D. Wang, Jeffrey Lam, Zhihong Mai