| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2025 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Symmetry
|
| 2025 | J | jnl |
Manag. Sci.
|
| 2024 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2024 | J | jnl |
Comput. Ind. Eng.
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
Adv. Eng. Informatics
|
| 2024 | J | jnl |
Appl. Intell.
|
| 2024 | J | jnl |
Comput. Ind. Eng.
|
| 2024 | — | conf |
ICEIT
|
| 2023 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2023 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2023 | J | jnl |
Inf. Sci.
|
| 2023 | A* | conf |
SIGCOMM
|
| 2022 | J | jnl |
Auton. Intell. Syst.
|
| 2022 | J | jnl |
Auton. Intell. Syst.
|
| 2022 | A* | conf |
CVPR
|
| 2022 | J | jnl |
CoRR
|
| 2021 | — | conf |
CASE
|
| 2021 | J | jnl |
J. Intell. Manuf.
|
| 2021 | — | conf |
CASE
|
| 2020 | J | jnl |
Robotics Comput. Integr. Manuf.
|
| 2020 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2020 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2020 | J | jnl |
Robotics Comput. Integr. Manuf.
|
| 2019 | J | jnl |
J. Intell. Manuf.
|
| 2019 | J | jnl |
Robotics Comput. Integr. Manuf.
|
| 2018 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2018 | B | conf |
SMC
|
| 2016 | J | jnl |
Int. J. Online Eng.
|
| 2016 | — | conf |
WOCC
|
| 2015 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2014 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2014 | — | conf |
IMIS
|
| 2013 | J | jnl |
Appl. Math. Comput.
|
| 2012 | J | jnl |
Int. J. Comput. Integr. Manuf.
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | Misc | conf |
VTS
|
| 2010 | — | conf |
ISIA
|
| 2010 | — | conf |
DFT
|
| 2009 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | — | conf |
DFT
|
| 2008 | J | jnl |
IEEE Des. Test Comput.
|
| 2006 | A | conf |
ITC
|
| 2005 | A | conf |
ITC
|
| 2005 | — | conf |
Asian Test Symposium
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2003 | J | jnl |
IEEE Des. Test Comput.
|
| 2002 | A | conf |
ITC
|