Zheng Shi

24 papers Journal 16Unranked 8
YearRankTypeTitle / Venue / Authors
2021 — conf
A 1-V Diode-Based Temperature Sensor with a Resolution FoM of 3.1pJ•K
CICC
Zhong Tang, Yun Fang, Xiao-Peng Yu, Nianxiong Nick Tan, Zheng Shi, Pieter Harpe
2021 J jnl
A BJT-Based CMOS Temperature Sensor With Duty-Cycle-Modulated Output and ±0.5°C (3σ) Inaccuracy From -40 °C to 125 °C.
IEEE Trans. Circuits Syst. II Express Briefs
Zhenyan Huang, Zhong Tang, Xiao-Peng Yu, Zheng Shi, Ling Lin, Nianxiong Nick Tan
2020 J jnl
A 1770-µm
IEEE J. Solid State Circuits
Zhong Tang, Yun Fang, Zheng Shi, Xiao-Peng Yu, Nianxiong Tan, Weiwei Pan
2020 J jnl
A Dynamic-Biased Resistor-Based CMOS Temperature Sensor With a Duty-Cycle-Modulated Output.
IEEE Trans. Circuits Syst. II Express Briefs
Zhong Tang, Yun Fang, Xiao-Peng Yu, Zheng Shi, Ling Lin, Nianxiong Nick Tan
2019 J jnl
A Reliability-Oriented Startup Analysis of Injection-Locked Frequency Divider Based on Broken Symmetry Theory.
IEEE Trans. Very Large Scale Integr. Syst.
Yun Fang, Zhong Tang, Xiao-Peng Yu, Zheng Shi, Kiat Seng Yeo
2019 J jnl
An Untrimmed BJT-Based Temperature Sensor With Dynamic Current-Gain Compensation in 55-nm CMOS Process.
IEEE Trans. Circuits Syst. II Express Briefs
Zhong Tang, Yun Fang, Zhenyan Huang, Xiaopeng Yu, Zheng Shi, Nianxiong Tan
2018 J jnl
A 2.4 mW 2.5 GHz multi-phase clock generator with duty cycle imbalance correction in 0.13 µm CMOS.
Integr.
Yun Fang, Xiaopeng Yu, Zheng Shi, Kiat Seng Yeo
2018 J jnl
A CMOS Temperature Sensor With Versatile Readout Scheme and High Accuracy for Multi-Sensor Systems.
IEEE Trans. Circuits Syst. I Regul. Pap.
Zhong Tang, Yun Fang, Xiaopeng Yu, Zheng Shi, Nianxiong Tan
2018 J jnl
Rate-Adaptive Protograph LDPC Codes for Multi-Level-Cell NAND Flash Memory.
IEEE Commun. Lett.
Pingping Chen, Kui Cai, Zheng Shi
2017 — conf
A novel layout automation flow to facilitate test chip design for standard cell characterization.
ASICON
Ludan Yang, Weiwei Pan, Zheng Shi, Yongjun Zheng
2017 — conf
Design and automatic generation of area-efficient ring oscillator based addressable test chips.
ASICON
Xiaoxin Dou, Weiwei Pan, Zheng Shi, Yongjun Zheng
2015 J jnl
A New On-chip Signal Generator for Charge-Based Capacitance Measurement Circuit.
J. Electron. Test.
Xiaopeng Yu, Rong Qian Tian, Wen Lin Xu, Zheng Shi
2015 J jnl
Fast Level-Set-Based Inverse Lithography Algorithm for Process Robustness Improvement and Its Application.
J. Comput. Sci. Technol.
Zhen Geng, Zheng Shi, Xiaolang Yan, Kai-sheng Luo, Weiwei Pan
2014 J jnl
SVM based layout retargeting for fast and regularized inverse lithography.
J. Zhejiang Univ. Sci. C
Kai-sheng Luo, Zheng Shi, Xiaolang Yan, Zhen Geng
2013 — conf
A New Level-Set-Based Inverse Lithography Algorithm for Process Robustness Improvement with Attenuated Phase Shift Mask.
CAD/Graphics
Zhen Geng, Zheng Shi, Xiaolang Yan, Kai-sheng Luo
2013 J jnl
Regularized level-set-based inverse lithography algorithm for IC mask synthesis.
J. Zhejiang Univ. Sci. C
Zhen Geng, Zheng Shi, Xiaolang Yan, Kai-sheng Luo
2012 J jnl
Array based HV/VH tree: an effective data structure for layout representation.
J. Zhejiang Univ. Sci. C
Jie Ren, Weiwei Pan, Yongjun Zheng, Zheng Shi, Xiaolang Yan
2011 — conf
A fully automated large-scale addressable test chip design with high reliability.
ECCTD
Bo Zhang, Weiwei Pan, Yongjun Zheng, Zheng Shi, Xiaolang Yan
2011 J jnl
A sparse matrix model-based optical proximity correction algorithm with model-based mapping between segments and control sites.
J. Zhejiang Univ. Sci. C
Bin Lin, Xiaolang Yan, Zheng Shi, Yiwei Yang
2011 J jnl
Erratum to: A sparse matrix model-based optical proximity correction algorithm with model-based mapping between segments and control sites.
J. Zhejiang Univ. Sci. C
Bin Lin, Xiaolang Yan, Zheng Shi, Yiwei Yang
2011 — conf
Using NMOS transistors as switches for accuracy and area-efficiency in large-scale addressable test array.
ISQED
Weiwei Pan, Jie Ren, Yongjun Zheng, Zheng Shi, Xiaolang Yan
2007 — conf
An Automated and Fast OPC Algorithm for OPC-Aware Layout Design.
ISQED
Ye Chen, Zheng Shi, Xiaolang Yan
2005 — conf
A new method for model based frugal OPC.
ASP-DAC
Xiaolang Yan, Ye Chen, Zheng Shi, Yue Ma
2005 J jnl
Full-IC manufacturability check based on dense silicon imaging.
Sci. China Ser. F Inf. Sci.
Xiaolang Yan, Zheng Shi, Ye Chen, Yue Ma, Gensheng Gao