| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Circuits Syst. Signal Process.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2025 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2023 | — | conf |
I2MTC
|
| 2022 | J | jnl |
Sensors
|
| 2021 | — | conf |
CAA SAFEPROCESS
|
| 2021 | — | conf |
I2MTC
|
| 2020 | J | jnl |
Neurocomputing
|
| 2019 | J | jnl |
Entropy
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Neurocomputing
|
| 2017 | J | jnl |
J. Electron. Test.
|
| 2017 | J | jnl |
Sensors
|
| 2017 | J | jnl |
IEEE Access
|
| 2016 | — | conf |
I2MTC
|
| 2014 | J | jnl |
Microelectron. J.
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2014 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | J | jnl |
IEEE Trans. Instrum. Meas.
|