Zhanhui Shi - RankMe

11 papers B 1Journal 9Unranked 1

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	Probabilistic Injection-Based Reliability Evaluation for Correlated Input Vectors in Sequential Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Jungang Lou
2025	J	`jnl`	An Efficient Area and Reliability Optimization Method for MPRM Circuits Based on High-dimensional Genetic Algorithm. ACM Trans. Design Autom. Electr. Syst. Yuhao Zhou, Jianhui Jiang, Zhenxue He, Ying Zhang, Chengcheng Chen, Zhanhui Shi, Wei Zhang, Keying Yang
2024	J	`jnl`	A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits. IEEE Trans. Computers Zhanhui Shi, Jie Xiao, Weidong Zhu, Jianhui Jiang
2024	J	`jnl`	ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou
2024	B	`conf`	HTV: Measuring Circuit Vulnerability to Hardware Trojan Insertion Based on Node Co-activation Analysis. TrustCom Shuiliang Chai, Zhanhui Shi, Yanjiao Gao, Yuhao Huang, Aizhu Liu, Jie Xiao
2024	J	`jnl`	Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient. IEEE Trans. Circuits Syst. II Express Briefs Zhanhui Shi, Jie Xiao, Jianhui Jiang, Ying Zhang, Yuhao Zhou
2022	J	`jnl`	BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks. IEEE Trans. Computers Jie Xiao, Zhanhui Shi, Xuhua Yang, Jungang Lou
2022	—	`conf`	Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model. ATS Weidong Zhu, Jianhui Jiang, Zhanhui Shi
2019	J	`jnl`	A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm. J. Comput. Sci. Technol. Jie Xiao, Zhanhui Shi, Jianhui Jiang, Xu-Hua Yang, Yujiao Huang, Haigen Hu
2019	J	`jnl`	Circuit reliability prediction based on deep autoencoder network. Neurocomputing Jie Xiao, Weifeng Ma, Jungang Lou, Jianhui Jiang, Yujiao Huang, Zhanhui Shi, Qing Shen, Xuhua Yang
2018	J	`jnl`	A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model. IEEE Access Jie Xiao, Jianhui Jiang, Xiaoxin Li, Yujiao Huang, Xuhua Yang, Zhanhui Shi, Jungang Lou