Zhanglei Wang

24 papers A 8B 3Misc 1Journal 9Unranked 3
YearRankTypeTitle / Venue / Authors
2012 B conf
Diagnostic system based on support-vector machines for board-level functional diagnosis.
ETS
Zhaobo Zhang, Xinli Gu, Yaohui Xie, Zhiyuan Wang, Zhanglei Wang, Krishnendu Chakrabarty
2012 J jnl
Physical-Defect Modeling and Optimization for Fault-Insertion Test.
IEEE Trans. Very Large Scale Integr. Syst.
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
2011 A conf
Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks.
ITC
Zhaobo Zhang, Krishnendu Chakrabarty, Zhanglei Wang, Zhiyuan Wang, Xinli Gu
2010 J jnl
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support.
IEEE Trans. Very Large Scale Integr. Syst.
Seongmoon Wang, Wenlong Wei, Zhanglei Wang
2010 Misc conf
Board-level fault diagnosis using Bayesian inference.
VTS
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
2010 A conf
Board-level fault diagnosis using an error-flow dictionary.
ITC
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
2010 — conf
Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test.
Asian Test Symposium
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
2009 J jnl
Deviation-Based LFSR Reseeding for Test-Data Compression.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty, Michael Bienek
2009 J jnl
Integrated LFSR Reseeding, Test-Access Optimization, and Test Scheduling for Core-Based System-on-Chip.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
2009 A conf
Physical defect modeling for fault insertion in system reliability test.
ITC
Zhaobo Zhang, Zhanglei Wang, Xinli Gu, Krishnendu Chakrabarty
2008 J jnl
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.
J. Electron. Test.
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault
2008 J jnl
Test Data Compression Using Selective Encoding of Scan Slices.
IEEE Trans. Very Large Scale Integr. Syst.
Zhanglei Wang, Krishnendu Chakrabarty
2008 J jnl
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Zhanglei Wang, Krishnendu Chakrabarty
2007 B conf
A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression.
ETS
Zhanglei Wang, Krishnendu Chakrabarty, Michael Bienek
2007 A conf
A low cost test data compression technique for high n-detection fault coverage.
ITC
Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar
2007 J jnl
Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics.
J. Electron. Test.
Zhanglei Wang, Krishnendu Chakrabarty
2007 J jnl
Scan-BIST based on cluster analysis and the encoding of repeating sequences.
ACM Trans. Design Autom. Electr. Syst.
Lei Li, Zhanglei Wang, Krishnendu Chakrabarty
2007 A conf
SoC testing using LFSR reseeding, and scan-slice-based TAM optimization and test scheduling.
DATE
Zhanglei Wang, Krishnendu Chakrabarty, Seongmoon Wang
2006 — conf
An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time.
ATS
Zhanglei Wang, Krishnendu Chakrabarty
2006 — conf
Power-Aware Test Data Compression for Embedded IP Cores.
ATS
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Serge Pravossoudovitch, Christian Landrault
2006 A conf
Test set enrichment using a probabilistic fault model and the theory of output deviations.
DATE
Zhanglei Wang, Krishnendu Chakrabarty, Michael Gössel
2005 B conf
Built-in self-test of molecular electronics-based nanofabrics.
ETS
Zhanglei Wang, Krishnendu Chakrabarty
2005 A conf
Test data compression for IP embedded cores using selective encoding of scan slices.
ITC
Zhanglei Wang, Krishnendu Chakrabarty
2005 A conf
Using built-in self-test and adaptive recovery for defect tolerance in molecular electronics-based nanofabrics.
ITC
Zhanglei Wang, Krishnendu Chakrabarty