Zahava Koren - RankMe

60 papers A* 2A 4C 2Journal 13Unranked 39

Year	Rank	Type	Title / Venue / Authors
2024	—	`conf`	Image Degradation due to Interacting Hot Pixels and SEUs. DFT Glenn H. Chapman, Alireza Farahmandpour, Amit Chakma, Israel Koren, Zahava Koren
2023	—	`conf`	Image Degradation in Time Due to Interacting Hot Pixels. DFT Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren
2022	—	`conf`	Image Degradation due to Interacting Adjacent Hot Pixels. DFT Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2021	—	`conf`	Dependence of SEUs in Digital Cameras on Pixel size and Elevation. DFT Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2020	—	`conf`	Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. DFT Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren
2019	—	`conf`	Detecting SEUs in Noisy Digital Imagers with small pixels. DFT Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren
2019	—	`conf`	Image degradation from hot pixel defects with pixel size shrinkage. IMSE Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2018	—	`conf`	Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. DFT Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren
2018	—	`conf`	Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. IMSE Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren
2017	—	`conf`	Exploring soft errors (SEUs) with digital imager pixels ranging from 7 to 1.3 μm. DFT Glenn H. Chapman, Parham Purbakht, Peter Le, Israel Koren, Zahava Koren
2017	—	`conf`	Hot Pixel Behavior as Pixel Size Reduces to 1 micron. IMSE Glenn H. Chapman, Rahul Thomas, Israel Koren, Zahava Koren
2016	—	`conf`	Experimental study and analysis of soft and permanent errors in digital cameras. DFT Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Israel Koren, Zahava Koren
2016	—	`conf`	Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. IMSE Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
2015	—	`conf`	Enhanced correction methods for high density hot pixel defects in digital imagers. IMSE Glenn H. Chapman, Rahul Thomas, Rohit Thomas, Zahava Koren, Israel Koren
2015	—	`conf`	Single Event Upsets and Hot Pixels in digital imagers. DFTS Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren
2014	—	`conf`	Correcting high-density hot pixel defects in digital imagers. IMSE Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
2014	—	`conf`	Improved correction for hot pixels in digital imagers. DFT Glenn H. Chapman, Rohit Thomas, Rahul Thomas, Israel Koren, Zahava Koren
2014	J	`jnl`	Scheduling imprecise task graphs for real-time applications. Int. J. Embed. Syst. R. C. Ravindran, C. Mani Krishna, Israel Koren, Zahava Koren
2013	—	`conf`	Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications Glenn H. Chapman, Rohit Thomas, Zahava Koren, Israel Koren
2013	—	`conf`	Improved image accuracy in Hot Pixel degraded digital cameras. DFTS Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
2012	—	`conf`	Cost Functions for Scheduling Tasks in Cyber-physical Systems. ICINCO (1) Abhinna Jain, C. M. Krishna, Israel Koren, Zahava Koren
2012	C	`conf`	Do more camera pixels result in a better picture? IOLTS Glenn H. Chapman, Israel Koren, Zahava Koren
2012	—	`conf`	Projecting the rate of in-field pixel defects based on pixel size, sensor area, and ISO. Sensors, Cameras, and Systems for Industrial and Scientific Applications Glenn H. Chapman, Jenny Leung, Rohit Thomas, Ana I. L. Namburete, Zahava Koren, Israel Koren
2012	—	`conf`	Relating digital imager defect rates to pixel size, sensor area and ISO. DFT Glenn H. Chapman, Rohit Thomas, Israel Koren, Zahava Koren
2011	—	`conf`	Predicting Pixel Defect Rates Based on Image Sensor Parameters. DFT Glenn H. Chapman, Jenny Leung, Ana I. L. Namburete, Israel Koren, Zahava Koren
2011	—	`conf`	Tradeoffs in imager design parameters for sensor reliability. Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications Glenn H. Chapman, Jenny Leung, Rahul Thomas, Zahava Koren, Israel Koren
2010	—	`conf`	Tradeoffs in Imager Design with Respect to Pixel Defect Rates. DFT Glenn H. Chapman, Jenny Leung, Israel Koren, Zahava Koren
2009	—	`conf`	Characterization of Gain Enhanced In-Field Defects in Digital Imagers. DFT Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
2009	J	`jnl`	Event-driven adaptive duty-cycling in sensor networks. Int. J. Sens. Networks Srikanth Sundaresan, Israel Koren, Zahava Koren, C. Mani Krishna
2009	—	`conf`	Statistical identification and analysis of defect development in digital imagers. Digital Photography Jenny Leung, Glenn H. Chapman, Zahava Koren, Israel Koren
2008	—	`conf`	Automatic Detection of In-field eld Defect Growth in Image Sensors. DFT Jenny Leung, Glenn H. Chapman, Israel Koren, Zahava Koren
2007	—	`conf`	Identification of in-field defect development in digital image sensors. Digital Photography Jozsef Dudas, Linda Wu, Cory Jung, Glenn H. Chapman, Zahava Koren, Israel Koren
2007	—	`conf`	Quantitative Analysis of In-Field Defects in Image Sensor Arrays. DFT Jenny Leung, Jozsef Dudas, Glenn H. Chapman, Israel Koren, Zahava Koren
2006	—	`conf`	On-Line Mapping of In-Field Defects in Image Sensor Arrays. DFT Jozsef Dudas, Cory Jung, Linda Wu, Glenn H. Chapman, Israel Koren, Zahava Koren
2005	—	`conf`	On-Line Identification of Faults in Fault-Tolerant Imagers. DFT Glenn H. Chapman, Israel Koren, Zahava Koren, Jozsef Dudas, Cory Jung
2004	J	`jnl`	A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. IEEE Des. Test Comput. Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren
2004	C	`conf`	Application-Level Fault Tolerance in the Orbital Thermal Imaging Spectrometer. PRDC E. Ciocca, Israel Koren, Zahava Koren, C. Mani Krishna, Daniel S. Katz
2003	A	`conf`	Pre-Processing Input Data to Augment Fault Tolerance in Space Applications. DSN Jayakrishnan Nair, Zahava Koren, Israel Koren, C. Mani Krishna
2002	A	`conf`	Using Rational Approximations for Evaluating the Reliablity of Highly Reliable Systems. IPDPS Zahava Koren, J. Rajagopal, C. Mani Krishna, Israel Koren, W. Wang, J. Loman
2001	—	`conf`	Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip. DFT Israel Koren, Zahava Koren, Glenn H. Chapman
2000	—	`conf`	A Self-Correcting Active Pixel Camera. DFT Israel Koren, Zahava Koren, Glenn H. Chapman
2000	J	`jnl`	Incorporating Yield Enhancement into the Floorplanning Process. IEEE Trans. Computers Israel Koren, Zahava Koren
2000	A	`conf`	Synthesis of Interconnection Networks: A Novel Approach. DSN Vijay Lakamraju, Zahava Koren, C. Mani Krishna
1998	J	`jnl`	Defect tolerance in VLSI circuits: techniques and yield analysis. Proc. IEEE Israel Koren, Zahava Koren
1998	—	`conf`	Measuring the Vulnerability of Interconnection Networks in Embedded Systems. IPPS/SPDP Workshops Vijay Lakamraju, Zahava Koren, Israel Koren, C. Mani Krishna
1998	—	`conf`	Surge Handling as a Measure of Real-Time System Dependability. IPPS/SPDP Workshops Zahava Koren, Israel Koren, C. Mani Krishna
1998	—	`conf`	Yield and Routing Objectives in Floorplanning. DFT Israel Koren, Zahava Koren
1997	—	`conf`	Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs. DFT Israel Koren, Zahava Koren
1997	J	`jnl`	On the effect of floorplanning on the yield of large area integrated circuits. IEEE Trans. Very Large Scale Integr. Syst. Zahava Koren, Israel Koren
1994	J	`jnl`	A statistical study of defect maps of large area VLSI IC's. IEEE Trans. Very Large Scale Integr. Syst. Israel Koren, Zahava Koren, Charles H. Stapper
1994	J	`jnl`	The Hyeti Defect Tolerant Microprocessor: A Practical Experiment and its Cost-Effectiveness Analysis. IEEE Trans. Computers Régis Leveugle, Zahava Koren, Israel Koren, Gabriele Saucier, Norbert Wehn
1993	J	`jnl`	A Unified Negative-Binomial Distribution for Yield Analysis of Defect-Tolerant Circuits. IEEE Trans. Computers Israel Koren, Zahava Koren, Charles H. Stapper
1993	—	`conf`	Does the Floorplan of a Chip Affect Its Yield? DFT Zahava Koren, Israel Koren
1991	J	`jnl`	Discrete and Continuous Models for the Performance of Reconfigurable Multistage Systems. IEEE Trans. Computers Israel Koren, Zahava Koren
1991	A*	`conf`	WDM Passive Star-Protocols and Performance Analysis. INFOCOM Aura Ganz, Zahava Koren
1988	J	`jnl`	Designing interconnection buses in VLSI and WSI for maximum yield and minimum delay. IEEE J. Solid State Circuits Israel Koren, Zahava Koren, Dhiraj K. Pradhan
1988	A	`conf`	On the Bandwidth of a Multi-Stage Network in the Presence of Faulty Components. ICDCS Israel Koren, Zahava Koren
1988	J	`jnl`	Prioritized demand assignment protocols and their evaluation. IEEE Trans. Commun. Imrich Chlamtac, Aura Ganz, Zahava Koren
1986	A*	`conf`	A model for evaluating demand assignment protocols with arbitrary workloads. SIGCOMM Zahava Koren, Imrich Chlamtac, Aura Ganz
1986	J	`jnl`	Analysis of a Class of Recovery Procedures. IEEE Trans. Computers Israel Koren, Zahava Koren, Stephen Y. H. Su