Yves Ousten

20 papers Journal 19Unranked 1
YearRankTypeTitle / Venue / Authors
2018 — conf
A new non-magnetic trimmer for the magnetic resonance imaging system.
MOCAST
Zaineb Jebri, Isabelle Bord-Majek, Celine Delafosse, Christophe Pasquet, Yves Ousten
2018 J jnl
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Microelectron. Reliab.
M. Balmont, Isabelle Bord-Majek, B. Poupard, Laurent Béchou, Yves Ousten
2015 J jnl
Liquid Crystal Polymer for QFN packaging: Predicted thermo-mechanical fatigue and Design for Reliability.
Microelectron. Reliab.
Walide Chenniki, Isabelle Bord-Majek, Mélanie Louarn, Vincent Gaud, Jean-Luc Diot, Komkrisd Wongtimnoi, Yves Ousten
2015 J jnl
Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage.
Microelectron. Reliab.
Raphael Baillot, Yannick Deshayes, Yves Ousten, Laurent Béchou
2013 J jnl
Power MOSFET active power cycling for medical system reliability assessment.
Microelectron. Reliab.
Amadou Sow, Sinivassane Somaya, Yves Ousten, Jean-Michel Vinassa, Fanny Patoureaux
2011 J jnl
An original DoE-based tool for silicon photodetectors EoL estimation in space environments.
Microelectron. Reliab.
Piero Spezzigu, Laurent Béchou, Gianandrea Quadri, Olivier Gilard, Yves Ousten, Massimo Vanzi
2010 J jnl
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses.
Microelectron. Reliab.
Raphael Baillot, Yannick Deshayes, Laurent Béchou, T. Buffeteau, I. Pianet, C. Armand, F. Voillot, S. Sorieul, Yves Ousten
2008 J jnl
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications.
Microelectron. Reliab.
M. L. Bourqui, Laurent Béchou, Olivier Gilard, Yannick Deshayes, Pamela Del Vecchio, L. S. How, F. Rosala, Yves Ousten, André Touboul
2008 J jnl
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation.
Microelectron. Reliab.
Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, Philippe Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten
2006 J jnl
Defect detection in multilayer ceramic capacitors.
Microelectron. Reliab.
V. Krieger, Wolfgang Wondrak, A. Dehbi, W. Bartel, Yves Ousten, Bruno Levrier
2006 J jnl
Use of signal processing imaging for the study of a 3D package in harsh environment.
Microelectron. Reliab.
Jean Augereau, Yves Ousten, Bruno Levrier, Laurent Béchou
2005 J jnl
Failure mechanisms and qualification testing of passive components.
Microelectron. Reliab.
H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Yves Ousten, G. Lekens, A. Dehbi
2005 J jnl
Vibration lifetime modelling of PCB assemblies using steinberg model.
Microelectron. Reliab.
A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak
2004 J jnl
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.
Microelectron. Reliab.
Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto
2003 J jnl
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy.
IEEE Trans. Instrum. Meas.
Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano
2003 J jnl
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.
Microelectron. Reliab.
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
2002 J jnl
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets).
Microelectron. Reliab.
Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto
2002 J jnl
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions.
Microelectron. Reliab.
B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier
2002 J jnl
Evaluation of a micropackaging analysis technique by highfrequency microwaves.
Microelectron. Reliab.
Geneviève Duchamp, Yves Ousten, Yves Danto
2002 J jnl
High temperature reliability testing of aluminum and tantalum electrolytic capacitors.
Microelectron. Reliab.
A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto