Yves Danto

26 papers C 2Journal 22Unranked 2
YearRankTypeTitle / Venue / Authors
2007 J jnl
Dynamic void formation in a DD-copper-structure with different metallization geometry.
Microelectron. Reliab.
Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont
2007 J jnl
Torsion test applied for reballing and solder paste volume evaluation.
Microelectron. Reliab.
W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto
2006 J jnl
Improved physical understanding of intermittent failure in continuous monitoring method.
Microelectron. Reliab.
W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto
2006 C conf
Multi-level Modeling of Hot Carrier Injection for Reliability.
FDL
Corinne Bestory, François Marc, Hervé Levi, Yves Danto
2005 J jnl
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
Microelectron. Reliab.
S. Huyghe, Laurent Béchou, Nicolas Zerounian, Yannick Deshayes, Frédéric Aniel, A. Denolle, Dominique Laffitte, Jean-Luc Goudard, Yves Danto
2005 J jnl
Vibration lifetime modelling of PCB assemblies using steinberg model.
Microelectron. Reliab.
A. Dehbi, Yves Ousten, Yves Danto, Wolfgang Wondrak
2004 J jnl
How to study delamination in plastic encapsulated devices.
Microelectron. Reliab.
Hélène Frémont, Jean-Yves Delétage, Kirsten Weide-Zaage, Yves Danto
2004 J jnl
Reliability of Low-Cost PCB Interconnections for Telecommunication Applications.
Microelectron. Reliab.
Geneviève Duchamp, Frédéric Verdier, Yannick Deshayes, François Marc, Yves Ousten, Yves Danto
2004 J jnl
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.
Microelectron. Reliab.
Laurent Mendizabal, Laurent Béchou, Yannick Deshayes, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard, F. Houé
2003 J jnl
A physical approach on SCOBIC investigation in VLSI.
Microelectron. Reliab.
Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto
2003 J jnl
Ageing simulation of MOSFET circuit using a VHDL-AMS behavioural modelling: an experimental case study.
Microelectron. Reliab.
B. Mongellaz, François Marc, Yves Danto
2003 J jnl
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy.
IEEE Trans. Instrum. Meas.
Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano
2003 J jnl
Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.
Microelectron. Reliab.
G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys
2003 J jnl
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectron. Reliab.
Laurent Mendizabal, Jean-Louis Verneuil, Laurent Béchou, Christelle Aupetit-Berthelemot, Yannick Deshayes, Frédéric Verdier, Jean-Michel Dumas, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
2003 J jnl
Moisture diffusion in BCB resins used for MEMS packaging.
Microelectron. Reliab.
Angie Tetelin, Claude Pellet, Jean-Yves Delétage, B. Carbonne, Yves Danto
2003 J jnl
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Microelectron. Reliab.
Jean-Yves Delétage, F. J.-M. Verdier, Bernard Plano, Yannick Deshayes, Laurent Béchou, Yves Danto
2003 C conf
Reliability simulation of electronic circuits with VHDL-AMS.
FDL
François Marc, B. Mongellaz, Yves Danto
2003 J jnl
Simulation of time depending void formation in copper, aluminum and tungsten plugged via structures.
Microelectron. Reliab.
David Dalleau, Kirsten Weide-Zaage, Yves Danto
2003 J jnl
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectron. Reliab.
Yannick Deshayes, Laurent Béchou, Jean-Yves Delétage, Frédéric Verdier, Yves Danto, Dominique Laffitte, Jean-Luc Goudard
2002 J jnl
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets).
Microelectron. Reliab.
Jean Augereau, Yves Ousten, Laurent Béchou, Yves Danto
2002 — conf
Behavioral Modeling of Analogue and Mixed Integrated Systems with VHDL-AMS for RF Applications.
SBCCI
Ahmed Fakhfakh, Hervé Levi, Noëlle Milet-Lewis, Yves Danto
2002 J jnl
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions.
Microelectron. Reliab.
B. Trégon, Yves Ousten, Yves Danto, Laurent Béchou, Bernard Parmentier
2002 J jnl
Contribution to ageing simulation of complex analogue circuit using VHDL-AMS behavioural modelling language.
Microelectron. Reliab.
B. Mongellaz, François Marc, Noëlle Milet-Lewis, Yves Danto
2002 J jnl
Evaluation of a micropackaging analysis technique by highfrequency microwaves.
Microelectron. Reliab.
Geneviève Duchamp, Yves Ousten, Yves Danto
2002 J jnl
High temperature reliability testing of aluminum and tantalum electrolytic capacitors.
Microelectron. Reliab.
A. Dehbi, Wolfgang Wondrak, Yves Ousten, Yves Danto
1997 — conf
A World-Wide-Web based instrumentation pool real testing in a virtual world.
MSE
Thomas Zimmer, Patrice Kadionik, Yves Danto