| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
A 0.4 V, 12.2 pW Leakage, 36.5 fJ/Step Switching Efficiency Data Retention Flip-Flop in 22 nm FDSOI.
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | — | conf |
ICEIC
|
| 2025 | J | jnl |
Knowl. Based Syst.
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | J | jnl |
Trans. GIS
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Quantum Inf. Process.
|
| 2024 | — | conf |
A-SSCC
|
| 2023 | J | jnl |
Inf.
|
| 2023 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2022 | — | conf |
VTC Fall
|
| 2021 | — | conf |
A-SSCC
|
| 2021 | C | conf |
ISCAS
|
| 2021 | C | conf |
ISCAS
|
| 2021 | C | conf |
ISCAS
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | — | conf |
VTC Fall
|
| 2021 | J | jnl |
IEEE Open J. Circuits Syst.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | — | conf |
VTC Fall
|
| 2020 | — | conf |
ICTA
|
| 2020 | C | conf |
ISCAS
|
| 2019 | J | jnl |
IET Signal Process.
|