Yuta Yamato - RankMe

29 papers A 8B 3C 2Misc 2Journal 9Unranked 5

Year	Rank	Type	Title / Venue / Authors
2016	B	`conf`	Reliability enhancement of embedded memory with combination of aging-aware adaptive in-field self-repair and ECC. ETS Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue
2016	J	`jnl`	Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair. IEICE Trans. Inf. Syst. Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Yasuo Sato, Michiko Inoue
2016	—	`conf`	Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test. ATS Stefan Holst, Eric Schneider, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Hans-Joachim Wunderlich, Michael A. Kochte
2015	B	`conf`	An ECC-based memory architecture with online self-repair capabilities for reliability enhancement. ETS Gian Mayuga, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue, Yasuo Sato
2014	A	`conf`	Memory block based scan-BIST architecture for application-dependent FPGA testing. FPGA Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue
2014	—	`conf`	Parallel Path Delay Fault Simulation for Multi/Many-Core Processors with SIMD Units. ATS Yussuf Ali, Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue
2013	J	`jnl`	A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing. IEICE Trans. Inf. Syst. Kohei Miyase, Ryota Sakai, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara
2013	J	`jnl`	LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing. IEEE Des. Test Yuta Yamato, Kohei Miyase, Seiji Kajihara, Xiaoqing Wen, Laung-Terng Wang, Michael A. Kochte
2012	A	`conf`	A fast and accurate per-cell dynamic IR-drop estimation method for at-speed scan test pattern validation. ITC Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue
2012	Misc	`conf`	A novel capture-safety checking method for multi-clock designs and accuracy evaluation with delay capture circuits. VTS Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara
2011	J	`jnl`	A GA-Based IEICE Trans. Inf. Syst. Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara
2011	A	`conf`	A novel scan segmentation design method for avoiding shift timing failure in scan testing. ITC Yuta Yamato, Xiaoqing Wen, Michael A. Kochte, Kohei Miyase, Seiji Kajihara, Laung-Terng Wang
2011	J	`jnl`	Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing. IEICE Trans. Inf. Syst. Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara
2011	—	`conf`	Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel
2011	Misc	`conf`	Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor
2011	A	`conf`	SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures. ISLPED Michael A. Kochte, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Kazunari Enokimoto, Hans-Joachim Wunderlich
2011	A	`conf`	Transition-Time-Relation based capture-safety checking for at-speed scan test generation. DATE Kohei Miyase, Xiaoqing Wen, Masao Aso, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara
2010	J	`jnl`	A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja
2010	J	`jnl`	High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. IEICE Trans. Inf. Syst. Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor
2009	C	`conf`	A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-speed Scan Testing. PRDC Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Hiroshi Furukawa, Seiji Kajihara
2009	A	`conf`	A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment. ICCAD Kohei Miyase, Yuta Yamato, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Xiaoqing Wen, Seiji Kajihara
2009	—	`conf`	CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing. Asian Test Symposium Kazunari Enokimoto, Xiaoqing Wen, Yuta Yamato, Kohei Miyase, H. Sone, Seiji Kajihara, Masao Aso, Hiroshi Furukawa
2008	B	`conf`	A Capture-Safe Test Generation Scheme for At-Speed Scan Testing. ETS Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Hiroshi Furukawa, Yuta Yamato, Atsushi Takashima, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja
2008	J	`jnl`	A Novel Per-Test Fault Diagnosis Method Based on the Extended IEICE Trans. Inf. Syst. Yuta Yamato, Yusuke Nakamura, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara
2008	—	`conf`	CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing. ATS Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor
2008	A	`conf`	Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification. ICCAD Kohei Miyase, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara
2007	A	`conf`	A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang
2006	J	`jnl`	A Per-Test Fault Diagnosis Method Based on the IEICE Trans. Inf. Syst. Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Yuta Yamato, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita
2006	C	`conf`	Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation. ICCD Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Yamato, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja