| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
CoRR
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | — | conf |
ICCIP
|
| 2025 | — | conf |
ICCIP
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Multim. Syst.
|
| 2024 | J | jnl |
Knowl. Based Syst.
|
| 2024 | A* | conf |
CVPR
|
| 2024 | J | jnl |
CoRR
|
| 2023 | J | jnl |
Remote. Sens.
|
| 2023 | — | conf |
EITCE
|
| 2023 | — | conf |
IC-NIDC
|
| 2023 | — | conf |
EITCE
|
| 2022 | — | conf |
EITCE
|
| 2022 | — | conf |
EITCE
|
| 2022 | — | conf |
EITCE
|
| 2021 | — | conf |
EITCE
|
| 2021 | — | conf |
EITCE
|
| 2021 | — | conf |
MWSCAS
|
| 2021 | — | conf |
EITCE
|
| 2021 | — | conf |
EITCE
|
| 2020 | — | conf |
EITCE
|
| 2020 | — | conf |
Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes.
EITCE
|
| 2020 | — | conf |
HCI (11)
|
| 2019 | J | jnl |
Remote. Sens.
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
Microelectron. Reliab.
|