| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | — | conf |
ICKII
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | — | conf |
ISGT Europe
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2013 | J | jnl |
Neural Comput. Appl.
|
| 2013 | — | conf |
ISIE
|
| 2012 | C | conf |
IAS
|
| 2011 | B | conf |
FUZZ-IEEE
|
| 2011 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | B | conf |
FUZZ-IEEE
|
| 2010 | C | conf |
ICMLA
|
| 2010 | J | jnl |
Int. J. Syst. Sci.
|
| 2010 | J | jnl |
Appl. Math. Comput.
|
| 2009 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2008 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2007 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2007 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2005 | J | jnl |
IEEE Trans. Dependable Secur. Comput.
|
| 2004 | J | jnl |
IEEE Trans. Computers
|
| 2004 | C | conf |
Reliability Evaluation of Dependable Distributed Computing Systems Based on Recursive Merge and BDD.
PRDC
|
| 2003 | B | conf |
COMPSAC
|
| 2002 | C | conf |
PRDC
|