Yunfei En

18 papers Journal 12Unranked 6
YearRankTypeTitle / Venue / Authors
2023 J jnl
A Composite Probe Capable of Simultaneously Measuring Two Orthogonal Magnetic-Fields.
IEEE Trans. Circuits Syst. II Express Briefs
Lei Wang, Xiaoxian Liu, Yunfei En, Zhangming Zhu
2022 J jnl
An Ultrawideband Multicomponent Differential Magnetic Probe for Near-Field Scanning.
IEEE Trans. Circuits Syst. II Express Briefs
Lei Wang, Yunfei En, Zhangming Zhu
2021 J jnl
Area-Efficient Extended 3-D Inductor Based on TSV Technology for RF Applications.
IEEE Trans. Very Large Scale Integr. Syst.
Chenbing Qu, Zhangming Zhu, Yunfei En, Liwei Wang, Xiaoxian Liu
2021 J jnl
Research on Negative Bias Temperature Instability Effects Under the Coupling of Total Ionizing Dose Irradiation for PDSOI MOSFETs.
IEEE Access
Chao Peng, Rui Gao, Zhifeng Lei, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang
2020 — conf
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs.
IRPS
Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang
2020 J jnl
Broadband Circularly Polarized Cross-Dipole Antenna With Multiple Modes.
IEEE Access
Lei Wang, Wenxiao Fang, Wei-Heng Shao, Bin Yao, Yun Huang, Yunfei En
2020 J jnl
Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET.
IEEE Access
Chao Peng, Zhifeng Lei, Rui Gao, Zhangang Zhang, Yiqiang Chen, Yunfei En, Yun Huang
2019 — conf
Distinguishing Interfacial Hole Traps in (110), (100) High-K Gate Stack.
IRPS
Yueyang Liu, Xiangwei Jiang, Liwei Wang, Yunfei En, Runsheng Wang
2019 — conf
Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2.
IRPS
Xiaolei Ma, Xiangwei Jiang, Jiezhi Chen, Liwei Wang, Yunfei En
2019 J jnl
Wideband Circularly Polarized Cross-Dipole Antenna With Parasitic Elements.
IEEE Access
Lei Wang, Wenxiao Fang, Yunfei En, Yun Huang, Wei-Heng Shao, Bin Yao
2018 J jnl
Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation.
Microelectron. Reliab.
Zhifeng Lei, H. X. Guo, M. H. Tang, C. Zeng, Zhangang Zhang, H. Chen, Yunfei En, Y. Huang, Yiqiang Chen, Chao Peng
2018 J jnl
The experimental analysis and the mechanical model for the debonding failure of TSV-Cu/Si interface.
Microelectron. Reliab.
Si Chen, Zhizhe Wang, Yunfei En, Yun Huang, Fei Qin, Tong An
2017 J jnl
Movable Noncontact RF Current Measurement on a PCB Trace.
IEEE Trans. Instrum. Meas.
Haimi Qiu, Wenxiao Fang, Yunfei En, Yun Huang, Yuan Liu, Ping Lai, Yiqiang Chen, Chunlei Shi
2017 — conf
Quality Evaluation of Digital Soft IP Core for FPGA System.
QRS Companion
Dengyun Lei, Liwei Wang, Jun Lin, Yunfei En
2017 J jnl
Radiation induced transconductance overshoot in the 130 nm partially-depleted SOI MOSFETs.
Microelectron. Reliab.
Chao Peng, Yunfei En, Zhengxuan Zhang, Yuan Liu, Zhifeng Lei
2015 — conf
A failure physics model for hardware Trojan detection based on frequency spectrum analysis.
IRPS
Chunhua He, Bo Hou, Liwei Wang, Yunfei En, Shaofeng Xie
2010 J jnl
Total-dose-induced edge effect in SOI NMOS transistors with different layouts.
Microelectron. Reliab.
Jie Liu, Jicheng Zhou, Hongwei Luo, Xuedong Kong, Yunfei En, Qian Shi, Yujuan He
2008 — conf
The irradiation effect of DC-DC power converter under X-ray.
APCCAS
Yunfei En, Yujuan He, Hongwei Luo, Qian Shi, Xianjun Kuang, Zhijian Pan