Yuki Yoshikawa

16 papers B 1C 2Misc 1Journal 2Unranked 10
YearRankTypeTitle / Venue / Authors
2015 — conf
Patchworking Multiple Pairwise Distances for Learning with Distance Matrices.
LVA/ICA
Ken Takano, Hideitsu Hino, Yuki Yoshikawa, Noboru Murata
2013 — conf
A binding algorithm in high-level synthesis for path delay testability.
ASP-DAC
Yuki Yoshikawa
2013 — conf
A study of thermal sensation with visuo-thermal projection interfaces.
GCCE
Yuki Yoshikawa, Daisuke Iwai, Kosuke Sato
2011 C conf
High-level synthesis for multi-cycle transient fault tolerant datapaths.
IOLTS
Tomoo Inoue, Hayato Henmi, Yuki Yoshikawa, Hideyuki Ichihara
2011 J jnl
Hybrid Test Application in Partial Skewed-Load Scan Design.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Yuki Yoshikawa, Tomomi Nuwa, Hideyuki Ichihara, Tomoo Inoue
2011 — conf
Test Compression Based on Lossy Image Encoding.
Asian Test Symposium
Hideyuki Ichihara, Yuka Iwamoto, Yuki Yoshikawa, Tomoo Inoue
2010 — conf
A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic.
DELTA
Tomoo Inoue, Nobukazu Izumi, Yuki Yoshikawa, Hideyuki Ichihara
2010 J jnl
A Practical Threshold Test Generation for Error Tolerant Application.
IEICE Trans. Inf. Syst.
Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue
2010 C conf
An FPGA-based fail-soft system with adaptive reconfiguration.
IOLTS
Ryoji Noji, Satoshi Fujie, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
2010 B conf
Hybrid test application in hybrid delay scan design.
ETS
Yuki Yoshikawa, Tomomi Nuwa, Hideyuki Ichihara, Tomoo Inoue
2009 — conf
A Practical Approach to Threshold Test Generation for Error Tolerant Circuits.
Asian Test Symposium
Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue
2009 Misc conf
A Synthesis Method to Alleviate Over-Testing of Delay Faults Based on RTL Don't Care Path Identification.
VTS
Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara
2009 — conf
Fast false path identification based on functional unsensitizability using RTL information.
ASP-DAC
Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara
2009 — conf
Reliability and Performance Analysis of FPGA-Based Fault Tolerant System.
DFT
Ryoji Noji, Satoshi Fujie, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
2007 — conf
False Path Identification using RTL Information and Its Application to Over-testing Reduction for Delay Faults.
ATS
Yuki Yoshikawa, Satoshi Ohtake, Hideo Fujiwara
2005 — conf
Design for Testability Based on Single-Port-Change Delay Testing for Data Paths.
Asian Test Symposium
Yuki Yoshikawa, Satoshi Ohtake, Michiko Inoue, Hideo Fujiwara