| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Microelectron. J.
|
| 2026 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2026 | J | jnl |
Adv. Eng. Informatics
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
PeerJ Comput. Sci.
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Int. J. Appl. Earth Obs. Geoinformation
|
| 2024 | J | jnl |
Neurocomputing
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Sensors
|
| 2023 | — | conf |
ASICON
|
| 2023 | J | jnl |
Sensors
|
| 2021 | J | jnl |
Digit. Commun. Networks
|
| 2021 | — | conf |
ASICON
|
| 2021 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
EURASIP J. Wirel. Commun. Netw.
|
| 2019 | — | conf |
ASICON
|
| 2019 | J | jnl |
CoRR
|
| 2019 | — | conf |
BioCAS
|
| 2018 | C | conf |
ISCAS
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
IEEE Trans. Biomed. Circuits Syst.
|
| 2018 | C | conf |
ISCAS
|
| 2018 | — | conf |
ISQED
|
| 2018 | B | conf |
ICIP
|
| 2017 | — | conf |
ASICON
|
| 2017 | — | conf |
ASICON
|
| 2017 | — | conf |
ASICON
|
| 2017 | — | conf |
ASICON
|
| 2017 | — | conf |
BioCAS
|
| 2017 | J | jnl |
IEICE Electron. Express
|
| 2016 | J | jnl |
J. Circuits Syst. Comput.
|
| 2016 | J | jnl |
A Systematic Study of ESD Protection Co-Design With High-Speed and High-Frequency ICs in 28 nm CMOS.
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2016 | — | conf |
BioCAS
|
| 2015 | — | conf |
ASICON
|
| 2015 | — | conf |
ASICON
|
| 2015 | — | conf |
ASICON
|
| 2015 | — | conf |
ASICON
|
| 2015 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | J | jnl |
Sci. China Inf. Sci.
|
| 2014 | — | conf |
ICISO
|
| 2013 | — | conf |
ASICON
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2013 | J | jnl |
IEICE Electron. Express
|
| 2013 | — | conf |
I2MTC
|
| 2013 | J | jnl |
Sci. China Inf. Sci.
|
| 2013 | — | conf |
ASICON
|
| 2013 | — | conf |
ASICON
|
| 2013 | C | conf |
ISCAS
|
| 2013 | — | conf |
ASICON
|
| 2013 | C | conf |
ISCAS
|
| 2013 | J | jnl |
IEEE J. Solid State Circuits
|
| 2013 | J | jnl |
Microelectron. Reliab.
|
| 2013 | — | conf |
ASICON
|
| 2012 | — | conf |
MWSCAS
|
| 2012 | — | conf |
ISIE
|
| 2012 | J | jnl |
Sci. China Inf. Sci.
|
| 2012 | — | conf |
ISIE
|
| 2012 | — | conf |
CICC
|
| 2012 | C | conf |
ISCAS
|
| 2011 | — | conf |
ASICON
|
| 2011 | — | conf |
ASICON
|
| 2011 | — | conf |
ASICON
|
| 2011 | — | conf |
A-SSCC
|
| 2011 | — | conf |
ASICON
|
| 2011 | J | jnl |
Sci. China Inf. Sci.
|
| 2008 | J | jnl |
Sci. China Ser. F Inf. Sci.
|
| 2008 | — | conf |
APCCAS
|
| 2007 | J | jnl |
Eng. Lett.
|
| 2006 | — | conf |
IMECS
|
| 2006 | J | jnl |
IEEE J. Solid State Circuits
|
| 2006 | — | conf |
APCCAS
|
| 2005 | — | conf |
CICC
|
| 2005 | — | conf |
CICC
|
| 2004 | J | jnl |
IEEE J. Solid State Circuits
|
| 2003 | — | conf |
CICC
|
| 2002 | — | conf |
CICC
|
| 2000 | J | jnl |
IEEE J. Solid State Circuits
|
| 1998 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 1996 | A | conf |
ISLPED
|