Yuanrui Fan

12 papers A* 1A 1Journal 8Unranked 2
YearRankTypeTitle / Venue / Authors
2022 J jnl
Just-In-Time Defect Identification and Localization: A Two-Phase Framework.
IEEE Trans. Software Eng.
Meng Yan, Xin Xia, Yuanrui Fan, Ahmed E. Hassan, David Lo, Shanping Li
2022 J jnl
The Impact of Duplicate Changes on Just-in-Time Defect Prediction.
IEEE Trans. Reliab.
Ruifeng Duan, Haitao Xu, Yuanrui Fan, Meng Yan
2021 A* conf
A Differential Testing Approach for Evaluating Abstract Syntax Tree Mapping Algorithms.
ICSE
Yuanrui Fan, Xin Xia, David Lo, Ahmed E. Hassan, Yuan Wang, Shanping Li
2021 J jnl
A Differential Testing Approach for Evaluating Abstract Syntax Tree Mapping Algorithms.
CoRR
Yuanrui Fan, Xin Xia, David Lo, Ahmed E. Hassan, Yuan Wang, Shanping Li
2021 J jnl
The Impact of Mislabeled Changes by SZZ on Just-in-Time Defect Prediction.
IEEE Trans. Software Eng.
Yuanrui Fan, Xin Xia, Daniel Alencar da Costa, David Lo, Ahmed E. Hassan, Shanping Li
2021 J jnl
What makes a popular academic AI repository?
Empir. Softw. Eng.
Yuanrui Fan, Xin Xia, David Lo, Ahmed E. Hassan, Shanping Li
2020 J jnl
Chaff from the Wheat: Characterizing and Determining Valid Bug Reports.
IEEE Trans. Software Eng.
Yuanrui Fan, Xin Xia, David Lo, Ahmed E. Hassan
2020 A conf
Deep Learning Based Valid Bug Reports Determination and Explanation.
ISSRE
Jianjun He, Ling Xu, Yuanrui Fan, Zhou Xu, Meng Yan, Yan Lei
2020 — conf
Effort-aware just-in-time defect identification in practice: a case study at Alibaba.
ESEC/SIGSOFT FSE
Meng Yan, Xin Xia, Yuanrui Fan, David Lo, Ahmed E. Hassan, Xindong Zhang
2020 — conf
JITO: a tool for just-in-time defect identification and localization.
ESEC/SIGSOFT FSE
Fangcheng Qiu, Meng Yan, Xin Xia, Xinyu Wang, Yuanrui Fan, Ahmed E. Hassan, David Lo
2020 J jnl
What Makes a Popular Academic AI Repository?
CoRR
Yuanrui Fan, Xin Xia, David Lo, Ahmed E. Hassan, Shanping Li
2018 J jnl
Early prediction of merged code changes to prioritize reviewing tasks.
Empir. Softw. Eng.
Yuanrui Fan, Xin Xia, David Lo, Shanping Li