| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
Int. J. Bifurc. Chaos
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | A | conf |
ICCAD
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
CoRR
|
| 2023 | — | conf |
EEET
|
| 2023 | J | jnl |
IET Signal Process.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
APCCAS
|
| 2022 | J | jnl |
Circuits Syst. Signal Process.
|
| 2022 | — | conf |
ICTA
|
| 2022 | — | conf |
APCCAS
|
| 2021 | — | conf |
EITCE
|
| 2021 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2021 | — | conf |
ISOCC
|
| 2021 | — | conf |
EITCE
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2020 | — | conf |
ICARM
|
| 2020 | — | conf |
EITCE
|
| 2020 | — | conf |
Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes.
EITCE
|
| 2019 | J | jnl |
IEEE Trans. Circuits Syst. I Regul. Pap.
|
| 2018 | C | conf |
ISCAS
|
| 2017 | J | jnl |
Sci. China Inf. Sci.
|
| 2015 | A | conf |
FPGA
|
| 2015 | A | conf |
A Novel Method for FPGA Test Based on Partial Reconfiguration and Sorting Algorithm (Abstract Only).
FPGA
|
| 2014 | A | conf |
FPGA
|
| 2014 | — | conf |
ICDIP
|
| 2011 | C | conf |
DASC
|
| 2009 | — | conf |
NCM
|
| 2009 | — | conf |
BroadBandCom
|
| 2008 | Misc | conf |
GrC
|
| 2008 | C | conf |
ISCAS
|
| 2007 | — | conf |
SITIS
|
| 2007 | — | conf |
ISQED
|
| 2007 | — | conf |
ICECS
|
| 2007 | C | conf |
ISCAS
|
| 2007 | — | conf |
ICECS
|
| 2006 | — | conf |
CCECE
|