| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2022 | — | conf |
OFC
|
| 2022 | — | conf |
OFC
|
| 2021 | — | conf |
IEEE BigData
|
| 2020 | — | conf |
ICPR Workshops (4)
|
| 2014 | — | conf |
ANT/SEIT
|
| 2014 | J | jnl |
ACM Trans. Embed. Comput. Syst.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | J | jnl |
J. Inf. Sci. Eng.
|
| 2013 | — | conf |
SUI
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2012 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | — | conf |
VLSI-DAT
|
| 2012 | Misc | conf |
VTS
|
| 2011 | Misc | conf |
VTS
|
| 2010 | B | conf |
ETS
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | — | conf |
SoCC
|
| 2010 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2009 | J | jnl |
IEEE Micro
|
| 2009 | Misc | conf |
VTS
|
| 2009 | — | conf |
Asian Test Symposium
|
| 2008 | J | jnl |
J. Electron. Test.
|
| 2008 | — | conf |
ATS
|
| 2007 | Misc | conf |
VTS
|
| 2007 | J | jnl |
Math. Methods Oper. Res.
|
| 2007 | J | jnl |
IET Comput. Digit. Tech.
|
| 2006 | — | conf |
DFT
|
| 2006 | B | conf |
ETS
|
| 2005 | — | conf |
ISCAS (1)
|