| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | A* | conf |
AAAI
|
| 2025 | J | jnl |
Lightweight Leather Surface Defect Inspection Model Design for Fast Classification and Segmentation.
Symmetry
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
RAIRO Oper. Res.
|
| 2023 | — | conf |
BCD
|
| 2020 | J | jnl |
Int. Trans. Oper. Res.
|
| 2020 | — | conf |
ICFET
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | — | conf |
SII
|
| 2015 | — | conf |
ECC
|
| 2015 | — | conf |
VLSI-DAT
|
| 2014 | J | jnl |
Comput. Stat.
|
| 2013 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2013 | A | conf |
ICCAD
|
| 2013 | — | conf |
ECCTD
|
| 2008 | — | conf |
FSKD (1)
|