Yousuke Miyake

16 papers B 1C 3Misc 1Journal 3Unranked 8
YearRankTypeTitle / Venue / Authors
2022 J jnl
A 1-ps Bin Size 4.87-ps Resolution FPGA Time-to-Digital Converter Based on Phase Wrapping Sorting and Selection.
IEEE Access
Poki Chen, Joshua Adiel Wijaya, Seiji Kajihara, Trio Adiono, Hsiang-Yu Chen, Ruei-Ting Wang, Yousuke Miyake
2022 — conf
On Correction of A Delay Value Using Ring-Oscillators for Aging Detection and Prediction.
ATS
Takaaki Kato, Yousuke Miyake, Seiji Kajihara
2020 J jnl
High-Precision PLL Delay Matrix With Overclocking and Double Data Rate for Accurate FPGA Time-to-Digital Converters.
IEEE Trans. Very Large Scale Integr. Syst.
Poki Chen, Jian-Ting Lan, Ruei-Ting Wang, Nguyen My Qui, John Carl Joel Salao Marquez, Seiji Kajihara, Yousuke Miyake
2020 Misc conf
Innovative Test Practices in Asia.
VTS
Takeshi Iwasaki, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Yukiya Miura, Smith Lai, Gavin Hung, Harry H. Chen, Haruo Kobayashi, Kazumi Hatayama
2020 — conf
On Evaluation for Aging-Tolerant Ring Oscillators with Accelerated Life Test And Its Application to A Digital Sensor.
ATS
Masayuki Gondo, Yousuke Miyake, Takaaki Kato, Seiji Kajihara
2020 C conf
On-Chip Delay Measurement for Degradation Detection And Its Evaluation under Accelerated Life Test.
IOLTS
Yousuke Miyake, Takaaki Kato, Seiji Kajihara, Masao Aso, Haruji Futami, Satoshi Matsunaga, Yukiya Miura
2020 — conf
Path Delay Measurement with Correction for Temperature And Voltage Variations.
ITC-Asia
Yousuke Miyake, Takaaki Kato, Seiji Kajihara
2019 — conf
A Selection Method of Ring Oscillators for An On-Chip Digital Temperature And Voltage Sensor.
ITC-Asia
Yousuke Miyake, Yasuo Sato, Seiji Kajihara
2019 C conf
On-Chip Delay Measurement for In-Field Test of FPGAs.
PRDC
Yousuke Miyake, Yasuo Sato, Seiji Kajihara
2019 — conf
On-Chip Test Clock Validation Using A Time-to-Digital Converter in FPGAs.
ITC-Asia
Yousuke Miyake, Seiji Kajihara, Poki Chen
2017 — conf
On the effects of real time and contiguous measurement with a digital temperature and voltage sensor.
ITC-Asia
Yousuke Miyake, Yasuo Sato, Seiji Kajihara
2016 J jnl
Temperature and Voltage Measurement for Field Test Using an Aging-Tolerant Monitor.
IEEE Trans. Very Large Scale Integr. Syst.
Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Yukiya Miura
2014 — conf
An On-Chip Digital Environment Monitor for Field Test.
ATS
Seiji Kajihara, Yousuke Miyake, Yasuo Sato, Yukiya Miura
2014 C conf
Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA.
PRDC
Yasuo Sato, Masafumi Monden, Yousuke Miyake, Seiji Kajihara
2014 — conf
Temperature and Voltage Estimation Using Ring-Oscillator-Based Monitor for Field Test.
ATS
Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Yukiya Miura
2012 B conf
On-chip temperature and voltage measurement for field testing.
ETS
Yukiya Miura, Yasuo Sato, Yousuke Miyake, Seiji Kajihara