Younwoo Yoo

12 papers Journal 5Unranked 7
YearRankTypeTitle / Venue / Authors
2026 J jnl
STAR-PIM: Self-Test and Repair Structure for Processing-in-Memory With Adder Tree-Based MAC.
IEEE Trans. Circuits Syst. I Regul. Pap.
Seung Ho Shin, Younwoo Yoo, Youngki Moon, Nuri Son, Dahoon Kim, Sungho Kang
2025 J jnl
PETRA: Powerful Early Termination-Based Redundancy Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Youngkwang Lee, Hyojun Yun, Younwoo Yoo, Sungho Kang
2025 J jnl
RAPID: Redundancy Analysis With Parallelized and Intelligent Distribution.
IEEE Access
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang
2023 — conf
GPU-Based Redundancy Analysis using Partitioning Method for Memory Repair.
ISOCC
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang
2023 — conf
Redundancy Analysis Simplification Scheme for High-Speed Memory Repair.
ISOCC
Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2023 J jnl
TRUST: Through-Silicon via Repair Using Switch Matrix Topology.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Hayoung Lee, Seung Ho Shin, Younwoo Yoo, Sungho Kang
2022 — conf
An Improved Early Termination Methodology Using Convolutional Neural Network.
ISOCC
Seung Ho Shin, Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Sungho Kang
2022 J jnl
ECMO: ECC Architecture Reusing Content-Addressable Memories for Obtaining High Reliability in DRAM.
IEEE Trans. Very Large Scale Integr. Syst.
Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2022 — conf
FAME: Fault Address Memory Structure for Repair Time Reduction.
ISOCC
Hayoung Lee, Sooryeong Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2022 — conf
PROG: Per-Row Output Generator for BOST.
ISOCC
Sooryeong Lee, Hayoung Lee, Younwoo Yoo, Seung Ho Shin, Sungho Kang
2021 — conf
An Effective Spare Allocation Methodology for 3D Memory Repair with BIRA.
ISOCC
Seung Ho Shin, Hayoung Lee, Younwoo Yoo, Sungho Kang
2021 — conf
Post-bond Repair of Line Faults with Double-bit ECC for 3D Memory.
ISOCC
Younwoo Yoo, Hayoung Lee, Seung Ho Shin, Sungho Kang