Young Hoon Kwark

13 papers A 1Journal 9Unranked 3
YearRankTypeTitle / Venue / Authors
2015 J jnl
A 1.4 pJ/bit, Power-Scalable 16×12 Gb/s Source-Synchronous I/O With DFE Receiver in 32 nm SOI CMOS Technology.
IEEE J. Solid State Circuits
Timothy O. Dickson, Yong Liu, Sergey V. Rylov, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Michael P. Beakes, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman
2014 — conf
A 1.4-pJ/b, power-scalable 16×12-Gb/s source-synchronous I/O with DFE receiver in 32nm SOI CMOS technology.
CICC
Timothy O. Dickson, Yong Liu, Sergey V. Rylov, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman
2012 J jnl
Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures.
IEEE Trans. Instrum. Meas.
Miroslav Kotzev, Renato Rimolo-Donadio, Young Hoon Kwark, Christian W. Baks, Xiaoxiong Gu, Christian Schuster
2008 A conf
Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects.
DATE
Renato Rimolo-Donadio, Christian Schuster, Xiaoxiong Gu, Young Hoon Kwark, Mark B. Ritter
2006 J jnl
A 10-Gb/s 5-Tap DFE/4-Tap FFE Transceiver in 90-nm CMOS Technology.
IEEE J. Solid State Circuits
John F. Bulzacchelli, Mounir Meghelli, Sergey V. Rylov, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, Lei Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman
2006 — conf
A 10Gb/s 5-Tap-DFE/4-Tap-FFE Transceiver in 90nm CMOS.
ISSCC
Mounir Meghelli, Sergey V. Rylov, John F. Bulzacchelli, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, L. Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman
2005 J jnl
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection.
IBM J. Res. Dev.
John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang
2003 — conf
45-Gb/s SiGe BiCMOS PRBS generator and PRBS checker [pseudorandom bit sequence].
CICC
Seongwon Kim, Mohit Kapur, Mounir Meghelli, Alexander V. Rylyakov, Young Hoon Kwark, Daniel J. Friedman
2003 J jnl
SiGe BiCMOS integrated circuits for high-speed serial communication links.
IBM J. Res. Dev.
Daniel J. Friedman, Mounir Meghelli, Benjamin D. Parker, Jungwook Yang, Herschel A. Ainspan, Alexander V. Rylyakov, Young Hoon Kwark, Mark B. Ritter, Lei Shan, Steven J. Zier, Michael Sorna, Mehmet Soyuer
2000 J jnl
Wide band home phone line characterization.
IEEE Trans. Consumer Electron.
Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark
1999 J jnl
Wide band AC power line characterization.
IEEE Trans. Consumer Electron.
Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark
1996 J jnl
Mobile Data Communications Systems [Book Review].
IEEE Commun. Mag.
Young Hoon Kwark
1996 J jnl
Wireless Data Networking [Book Review].
IEEE Commun. Mag.
Young Hoon Kwark