| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
CoRR
|
| 2025 | — | conf |
BigComp
|
| 2025 | — | conf |
BigComp
|
| 2025 | — | conf |
BigComp
|
| 2025 | — | conf |
BigComp
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
NAACL-HLT
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
EMNLP (Findings)
|
| 2024 | — | conf |
BigComp
|
| 2024 | — | conf |
BigComp
|
| 2024 | J | jnl |
Data Knowl. Eng.
|
| 2024 | J | jnl |
CoRR
|
| 2024 | — | conf |
ACL (Findings)
|
| 2024 | — | conf |
EMNLP (Findings)
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2023 | A | conf |
ECAI
|
| 2023 | — | conf |
BigComp
|
| 2023 | J | jnl |
CoRR
|
| 2023 | — | conf |
ACL (industry)
|
| 2022 | J | jnl |
CoRR
|
| 2022 | B | conf |
COLING
|
| 2022 | — | conf |
BigComp
|
| 2022 | — | conf |
BigComp
|
| 2021 | — | conf |
BigComp
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | — | conf |
BigComp
|
| 2020 | — | conf |
BigComp
|
| 2020 | — | conf |
BigComp
|
| 2020 | B | conf |
LREC
|
| 2019 | — | conf |
BigComp
|
| 2017 | J | jnl |
CoRR
|
| 2017 | — | conf |
EUSIPCO
|
| 2014 | — | conf |
ISSRE Workshops
|
| 2014 | — | conf |
ICEIC
|
| 2014 | — | conf |
ISIC
|
| 2014 | J | jnl |
IEEE Trans. Signal Process.
|
| 2014 | J | jnl |
IET Commun.
|
| 2013 | J | jnl |
IET Commun.
|
| 2013 | J | jnl |
J. Comput. Sci. Technol.
|
| 2013 | — | conf |
BMSB
|
| 2012 | J | jnl |
IEEE Trans. Broadcast.
|
| 2012 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2011 | J | jnl |
IEEE Trans. Broadcast.
|
| 2009 | J | jnl |
IEEE Trans. Broadcast.
|
| 2008 | J | jnl |
IEICE Trans. Commun.
|
| 2007 | J | jnl |
IEEE Trans. Consumer Electron.
|
| 2007 | B | conf |
SAFECOMP
|
| 2007 | J | jnl |
Neurocomputing
|
| 2006 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2005 | — | — |
|
| 2004 | — | conf |
ISCAS (2)
|
| 2004 | J | jnl |
Microelectron. J.
|
| 2004 | — | conf |
ISCAS (4)
|
| 2004 | J | jnl |
J. Inf. Sci. Eng.
|
| 2004 | — | conf |
SoCC
|
| 2003 | — | conf |
DFT
|
| 2003 | — | conf |
ISQED
|
| 2003 | — | conf |
Applied Informatics
|
| 2003 | — | conf |
CICC
|
| 2003 | J | jnl |
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment.
IEEE Trans. Instrum. Meas.
|
| 2003 | C | conf |
IDEAL
|