| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
Sensors
|
| 2010 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2008 | J | jnl |
IEICE Trans. Electron.
|
| 2008 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2007 | J | jnl |
IEICE Trans. Electron.
|
| 2007 | J | jnl |
IET Comput. Digit. Tech.
|
| 2006 | — | conf |
ATS
|
| 2005 | — | conf |
Asian Test Symposium
|