Yoonah Paik

11 papers Journal 10Unranked 1
YearRankTypeTitle / Venue / Authors
2024 J jnl
Optimal Model Partitioning with Low-Overhead Profiling on the PIM-based Platform for Deep Learning Inference.
ACM Trans. Design Autom. Electr. Syst.
Seok Young Kim, Jaewook Lee, Yoonah Paik, Chang Hyun Kim, Won Jun Lee, Seon Wook Kim
2024 J jnl
The Breakthrough Memory Solutions for Improved Performance on LLM Inference.
IEEE Micro
Byeongho Kim, Sanghoon Cha, Sangsoo Park, Jieun Lee, Sukhan Lee, Shinhaeng Kang, Jinin So, Kyungsoo Kim, Jin Jung, Jong-Geon Lee, Sunjung Lee, Yoonah Paik, Hyeonsu Kim, Jin-Seong Kim, Won-Jo Lee, Yuhwan Ro, Yeongon Cho, Jin Hyun Kim, Joon-Ho Song, Jaehoon Yu, Seungwon Lee, Jeonghyeon Cho, Kyomin Sohn
2023 J jnl
BL-PIM: Varying the Burst Length to Realize the All-Bank Performance and Minimize the Multi-Workload Interference for in-DRAM PIM.
IEEE Access
Chang Hyun Kim, Won Jun Lee, Yoonah Paik, Seok Young Kim, Seon Wook Kim
2023 J jnl
PISA-DMA: Processing-in-Memory Instruction Set Architecture Using DMA.
IEEE Access
Won Jun Lee, Chang Hyun Kim, Yoonah Paik, Seon Wook Kim
2022 J jnl
Achieving the Performance of All-Bank In-DRAM PIM With Standard Memory Interface: Memory-Computation Decoupling.
IEEE Access
Yoonah Paik, Chang Hyun Kim, Won Jun Lee, Seon Wook Kim
2022 J jnl
Silent-PIM: Realizing the Processing-in-Memory Computing With Standard Memory Requests.
IEEE Trans. Parallel Distributed Syst.
Chang Hyun Kim, Won Jun Lee, Yoonah Paik, Kiyong Kwon, Seok Young Kim, Il Park, Seon Wook Kim
2021 — conf
Tile-based Code Generation for Efficiently Accessing to Scratchpad Memory.
ICEIC
Jaewook Lee, Yoonah Paik, Seon Wook Kim
2020 J jnl
Generating Representative Test Sequences from Real Workload for Minimizing DRAM Verification Overhead.
ACM Trans. Design Autom. Electr. Syst.
Yoonah Paik, Seon Wook Kim, Dongha Jung, Minseong Kim
2019 J jnl
Design of Processing-"Inside"-Memory Optimized for DRAM Behaviors.
IEEE Access
Won Jun Lee, Chang Hyun Kim, Yoonah Paik, Jongsun Park, Il Park, Seon Wook Kim
2019 J jnl
Fault Tolerance Technique Offlining Faulty Blocks by Heap Memory Management.
ACM Trans. Design Autom. Electr. Syst.
Jaeyung Jun, Yoonah Paik, Gyeong Il Min, Seon Wook Kim, Youngsun Han
2016 J jnl
High-throughput low-area design of AES using constant binary matrix-vector multiplication.
Microprocess. Microsystems
Hokyoon Lee, Yoonah Paik, Jaeyung Jun, Youngsun Han, Seon Wook Kim