| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2026 | J | jnl |
Integr.
|
| 2026 | J | jnl |
Microelectron. J.
|
| 2026 | J | jnl |
Microelectron. J.
|
| 2025 | J | jnl |
J. Real Time Image Process.
|
| 2025 | J | jnl |
IEICE Electron. Express
|
| 2025 | J | jnl |
J. Circuits Syst. Comput.
|
| 2025 | J | jnl |
Int. J. Digit. Earth
|
| 2025 | J | jnl |
Integr.
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2024 | J | jnl |
J. Real Time Image Process.
|
| 2023 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2023 | J | jnl |
IEICE Trans. Electron.
|
| 2022 | J | jnl |
ACM Trans. Reconfigurable Technol. Syst.
|
| 2022 | J | jnl |
Microelectron. J.
|
| 2021 | — | conf |
ICTA
|
| 2021 | — | conf |
ASICON
|
| 2020 | J | jnl |
Integr.
|
| 2020 | J | jnl |
Image Vis. Comput.
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2020 | — | conf |
ICMSS
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2019 | J | jnl |
IEICE Electron. Express
|
| 2019 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2019 | C | conf |
ICCD
|
| 2017 | J | jnl |
Integr.
|
| 2011 | — | conf |
Calibration method considering second-order error term of timing skew for a novel multi-channel ADC.
ASICON
|
| 2007 | — | conf |
APPT
|