Yongkang Xue

12 papers A 1Journal 4Unranked 7
YearRankTypeTitle / Venue / Authors
2024 — conf
A New Method of Automatic Extraction of RTN and OMI-Friendly Implementation.
IRPS
Yu Xiao, Chenyang Zhang, Da Wang, Yongkang Xue, Pengpeng Ren, Zhigang Ji
2024 J jnl
A strong physical unclonable function with machine learning immunity for Internet of Things application.
Sci. China Inf. Sci.
Pengpeng Ren, Yongkang Xue, Linglin Jing, Lining Zhang, Runsheng Wang, Zhigang Ji
2024 — conf
Convolution-Based Vth Shift Prediction and the New 9T2C Pixel Circuit in LTPS TFT AMOLED.
IRPS
Shiyu Xia, Longda Zhou, Kewei Wang, Xiaobin Fan, Yongkang Xue, Qi Shan, Hannian Wang, Pengpeng Ren, Zhigang Ji, Ru Huang
2024 A conf
Enforcing hard constraints in physics-informed learning for transient TSV electromigration analysis.
ICCAD
Xiaoman Yang, Hai-Bao Chen, Wenjie Zhu, Yuhan Zhang, Yongkang Xue, Pengpeng Ren, Runsheng Wang, Zhigang Ji, Ru Huang
2024 J jnl
Fast Aging-Aware Timing Analysis Framework With Temporal-Spatial Graph Neural Network.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jinfeng Ye, Pengpeng Ren, Yongkang Xue, Hui Fang, Zhigang Ji
2024 — conf
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs.
IRPS
Zixuan Sun, Yongkang Xue, Haoran Lu, Pengpeng Ren, Zirui Wang, Zhigang Ji, Runsheng Wang, Ru Huang
2024 — conf
Investigation of Positive Bias Temperature Instability in advanced FinFET nodes.
IRPS
Yongkang Xue, Miaojia Yuan, Yu Li, Da Wang, Maokun Wu, Pengpeng Ren, Lining Zhang, Runsheng Wang, Zhigang Ji, Ru Huang
2024 — conf
Sub-20-nm DRAM Technology under Negative Bias Temperature Instability (NBTI): from Characterization to Physical Origin Identification.
IRPS
Da Wang, Yongkang Xue, Yong Liu, Pengpeng Ren, Zixuan Sun, Zirui Wang, Yueyang Liu, Zhijun Cheng, Haiyang Yang, Xiangli Liu, Blacksmith Wu, Kanyu Cao, Runsheng Wang, Zhigang Ji, Ru Huang
2023 — conf
Catching the Missing EM Consequence in Soft Breakdown Reliability in Advanced FinFETs: Impacts of Self-heating, On-State TDDB, and Layout Dependence.
VLSI Technology and Circuits
Zuoyuan Dong, Zixuan Sun, Xin Yang, Xiaomei Li, Yongkang Xue, Chen Luo, Puyang Cai, Zirui Wang, Shuying Wang, Yewei Zhang, Chaolun Wang, Pengpeng Ren, Zhigang Ji, Xing Wu, Runsheng Wang, Ru Huang
2023 — conf
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.
IRPS
Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang
2022 J jnl
Mapping South America's Drylands through Remote Sensing - A Review of the Methodological Trends and Current Challenges.
Remote. Sens.
Khalil Ali Ganem, Yongkang Xue, Ariane de Almeida Rodrigues, Washington Franca-Rocha, Marceli Terra de Oliveira, Nathália S. Carvalho, Efrain Yury Turpo Cayo, Marcos Reis Rosa, Andeise Cerqueira Dutra, Yosio Edemir Shimabukuro
2016 J jnl
Vegetation Responses to Climate Variability in the Northern Arid to Sub-Humid Zones of Sub-Saharan Africa.
Remote. Sens.
Khaldoun Rishmawi, Stephen D. Prince, Yongkang Xue