YongJoon Kim

17 papers A 1Misc 2Journal 10Unranked 4
YearRankTypeTitle / Venue / Authors
2016 J jnl
Temperature and voltage droop-aware test scheduling during scan shift operation.
IEICE Electron. Express
Taehee Lee, YongJoon Kim, Joon-Sung Yang
2010 J jnl
A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption.
IEICE Trans. Inf. Syst.
YongJoon Kim, Jaeseok Park, Sungho Kang
2010 J jnl
Selective Scan Slice Grouping Technique for Efficient Test Data Compression.
IEICE Trans. Inf. Syst.
YongJoon Kim, Jaeseok Park, Sungho Kang
2009 Misc conf
A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections.
VTS
Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang
2009 J jnl
Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time.
IEICE Trans. Inf. Syst.
YongJoon Kim, Myung-Hoon Yang, Jaeseok Park, Eunsei Park, Sungho Kang
2009 J jnl
Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume.
IEICE Electron. Express
YongJoon Kim, Jaeseok Park, Sungho Kang
2008 — conf
An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme.
ATS
Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang
2008 J jnl
An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.
J. Electron. Test.
Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang
2008 Misc conf
An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.
VTS
Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang
2008 — conf
XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults.
ATS
Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang
2007 — conf
High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects.
ATS
Sunghoon Chun, YongJoon Kim, Sungho Kang
2007 J jnl
MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.
J. Electron. Test.
Sunghoon Chun, YongJoon Kim, Sungho Kang
2006 — conf
An Effective Test Pattern Generation for Testing Signal Integrity.
ATS
YongJoon Kim, Myung-Hoon Yang, Youngkyu Park, Daeyeal Lee, Sungho Kang
2006 J jnl
MICRO: a new hybrid test data compression/decompression scheme.
IEEE Trans. Very Large Scale Integr. Syst.
Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang
2004 J jnl
A new maximal diagnosis algorithm for interconnect test.
IEEE Trans. Very Large Scale Integr. Syst.
YongJoon Kim, Hyun-Don Kim, Sungho Kang
2003 A conf
A New Maximal Diagnosis Algorithm for Bus-structured Systems.
ITC
YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang
2003 J jnl
Test-decompression mechanism using a variable-length multiple-polynomial LFSR.
IEEE Trans. Very Large Scale Integr. Syst.
Hong-Sik Kim, YongJoon Kim, Sungho Kang