| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Reliab.
|
| 2026 | J | jnl |
Inf. Sci.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
J. Syst. Softw.
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Appl. Intell.
|
| 2024 | J | jnl |
Mach. Vis. Appl.
|
| 2024 | J | jnl |
IEEE Trans. Reliab.
|
| 2023 | — | conf |
DSA
|
| 2023 | J | jnl |
Appl. Intell.
|
| 2022 | — | conf |
DSA
|
| 2022 | J | jnl |
IEEE Trans. Reliab.
|
| 2022 | — | conf |
DSA
|
| 2022 | J | jnl |
Connect. Sci.
|
| 2022 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2022 | — | conf |
DSA
|
| 2022 | J | jnl |
Appl. Intell.
|
| 2021 | — | conf |
DSA
|
| 2021 | — | conf |
WCSP
|
| 2021 | — | conf |
QRS Companion
|
| 2021 | J | jnl |
Mach. Vis. Appl.
|
| 2020 | J | jnl |
Neural Networks
|
| 2020 | J | jnl |
Int. J. Perform. Eng.
|
| 2020 | J | jnl |
IEEE Access
|
| 2019 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2018 | J | jnl |
Neural Networks
|
| 2018 | J | jnl |
Multim. Tools Appl.
|
| 2018 | J | jnl |
IEICE Trans. Inf. Syst.
|
| 2018 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Multim. Tools Appl.
|
| 2017 | J | jnl |
Sci. China Inf. Sci.
|
| 2017 | J | jnl |
Pattern Anal. Appl.
|
| 2016 | J | jnl |
Neural Process. Lett.
|
| 2016 | J | jnl |
Neural Process. Lett.
|
| 2016 | J | jnl |
Pattern Recognit.
|
| 2016 | J | jnl |
Pattern Recognit.
|
| 2016 | — | conf |
SATE
|
| 2016 | J | jnl |
IEEE Trans. Image Process.
|
| 2016 | — | conf |
QRS Companion
|
| 2015 | J | jnl |
Image Vis. Comput.
|
| 2013 | J | jnl |
IET Comput. Vis.
|
| 2012 | J | jnl |
Inf. Sci.
|
| 2012 | J | jnl |
Pattern Recognit.
|
| 2012 | J | jnl |
Knowl. Based Syst.
|
| 2012 | J | jnl |
Appl. Math. Comput.
|