| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2026 | J | jnl |
Appl. Soft Comput.
|
| 2026 | J | jnl |
Robotics Comput. Integr. Manuf.
|
| 2026 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | — | conf |
MICCAI (11)
|
| 2025 | J | jnl |
Int. J. Decis. Support Syst. Technol.
|
| 2024 | J | jnl |
Int. J. Knowl. Based Intell. Eng. Syst.
|
| 2024 | J | jnl |
Remote. Sens.
|
| 2024 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2024 | J | jnl |
IEEE Trans. Netw. Sci. Eng.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | — | conf |
ICIRA (6)
|
| 2024 | J | jnl |
Frontiers Robotics AI
|
| 2024 | J | jnl |
Comput. Methods Programs Biomed.
|
| 2024 | J | jnl |
Int. J. Bifurc. Chaos
|
| 2024 | — | conf |
ICIRA (6)
|
| 2023 | — | conf |
ICIRA (3)
|
| 2023 | — | conf |
ICIRA (3)
|
| 2023 | — | conf |
M2VIP
|
| 2023 | J | jnl |
IEEE Access
|
| 2023 | — | conf |
ICIRA (3)
|
| 2023 | — | conf |
ICIRA (3)
|
| 2022 | — | conf |
ICIRA (2)
|
| 2022 | — | conf |
ISMR
|
| 2020 | — | conf |
CASE
|
| 2019 | J | jnl |
Multim. Tools Appl.
|
| 2019 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2019 | J | jnl |
IEEE Trans. Veh. Technol.
|
| 2018 | — | conf |
CASE
|
| 2018 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2018 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2017 | — | conf |
CASE
|
| 2017 | — | conf |
CASE
|
| 2017 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2017 | J | jnl |
IEEE Access
|
| 2017 | J | jnl |
Frontiers Inf. Technol. Electron. Eng.
|
| 2017 | J | jnl |
Expert Syst. Appl.
|
| 2017 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2017 | J | jnl |
Eur. J. Oper. Res.
|
| 2015 | — | conf |
CASE
|
| 2015 | — | conf |
CASE
|
| 2015 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2015 | — | conf |
IEEM
|
| 2014 | C | conf |
ACC
|
| 2014 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2011 | J | jnl |
J. Intell. Manuf.
|
| 2010 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2010 | J | jnl |
J. Intell. Manuf.
|
| 2006 | — | conf |
Random Testing
|
| 2005 | A | conf |
ISSRE
|