| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
IACR Trans. Cryptogr. Hardw. Embed. Syst.
|
| 2025 | A | conf |
ITC
|
| 2025 | — | conf |
ASP-DAC
|
| 2025 | Misc | conf |
VTS
|
| 2025 | — | conf |
WPMC
|
| 2025 | Misc | conf |
FCCM
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | A | conf |
ITC
|
| 2025 | A | conf |
ICCAD
|
| 2024 | J | jnl |
Bit-by-Bit: Investigating the Vulnerabilities of Binary Neural Networks to Adversarial Bit Flipping.
Trans. Mach. Learn. Res.
|
| 2024 | A | conf |
ITC
|
| 2024 | A* | conf |
NSPG: Natural language Processing-based Security Property Generator for Hardware Security Assurance.
DAC
|
| 2024 | Misc | conf |
VTS
|
| 2024 | J | jnl |
IEEE Des. Test
|
| 2024 | Misc | conf |
VTS
|
| 2023 | J | jnl |
CoRR
|
| 2023 | A* | conf |
USENIX Security Symposium
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
CoRR
|
| 2023 | A | conf |
DATE
|
| 2023 | Misc | conf |
VTS
|
| 2023 | A | conf |
DATE
|
| 2023 | J | jnl |
CoRR
|
| 2022 | A* | conf |
DAC
|
| 2022 | B | conf |
ICIP
|
| 2022 | Misc | conf |
VTS
|
| 2022 | A | conf |
DATE
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | C | conf |
ICCD
|
| 2021 | J | jnl |
IEEE Des. Test
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2021 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2021 | A* | conf |
DAC
|
| 2021 | J | jnl |
IEEE J. Emerg. Sel. Topics Circuits Syst.
|
| 2021 | Misc | conf |
VTS
|
| 2020 | J | jnl |
IEEE Trans. Computers
|
| 2020 | Misc | conf |
VTS
|
| 2020 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2020 | A | conf |
DATE
|
| 2020 | J | jnl |
CoRR
|
| 2020 | C | conf |
ISCAS
|
| 2020 | A* | conf |
DAC
|
| 2020 | — | conf |
AsianHOST
|
| 2020 | J | jnl |
IEEE Des. Test
|
| 2020 | J | jnl |
CoRR
|
| 2020 | A | conf |
DATE
|
| 2019 | Misc | conf |
VTS
|
| 2019 | C | conf |
IOLTS
|
| 2019 | J | jnl |
Integr.
|
| 2019 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2019 | A | conf |
DATE
|
| 2019 | — | conf |
MTV
|
| 2019 | — | conf |
FPT
|
| 2019 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2019 | Misc | conf |
VTS
|
| 2019 | A | conf |
ICCAD
|
| 2019 | Misc | conf |
VTS
|
| 2019 | — | conf |
SMACD
|
| 2019 | C | conf |
ICCD
|
| 2019 | A | conf |
ITC
|
| 2019 | C | conf |
IOLTS
|
| 2019 | A | conf |
ITC
|
| 2019 | A | conf |
DATE
|
| 2018 | Misc | conf |
VTS
|
| 2018 | A | conf |
ITC
|
| 2018 | A | conf |
DATE
|
| 2018 | A | conf |
ITC
|
| 2018 | Misc | conf |
VTS
|
| 2018 | — | conf |
PATMOS
|
| 2018 | A | conf |
DATE
|
| 2017 | A | conf |
DATE
|
| 2017 | A | conf |
ICCAD
|
| 2017 | A | conf |
ITC
|
| 2017 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2017 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2017 | Misc | conf |
VTS
|
| 2017 | A | conf |
DATE
|
| 2017 | — | conf |
HOST
|
| 2017 | A | conf |
DATE
|
| 2017 | Misc | conf |
VTS
|
| 2017 | B | conf |
ETS
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
IEEE Des. Test
|
| 2017 | C | conf |
ISCAS
|
| 2017 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2017 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2016 | — | conf |
VLSI Circuits
|
| 2016 | A | conf |
ICCAD
|
| 2016 | — | conf |
MTV
|
| 2016 | C | conf |
ICCD
|
| 2016 | — | conf |
HOST
|
| 2016 | C | conf |
ISCAS
|
| 2016 | A | conf |
ITC
|
| 2016 | Misc | conf |
VTS
|
| 2016 | J | jnl |
IEEE Des. Test
|
| 2016 | Misc | conf |
VTS
|
| 2015 | A | conf |
ITC
|
| 2015 | J | jnl |
IEEE Trans. Neural Networks Learn. Syst.
|
| 2015 | A | conf |
ITC
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
IEEE Des. Test
|
| 2015 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2015 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2015 | J | jnl |
IEEE Trans. Computers
|
| 2015 | — | conf |
ISVLSI
|
| 2015 | — | conf |
HOST
|
| 2015 | C | conf |
ISCAS
|
| 2015 | C | conf |
IOLTS
|
| 2015 | A | conf |
ICCAD
|
| 2015 | Misc | conf |
VTS
|
| 2014 | A | conf |
DATE
|
| 2014 | J | jnl |
Proc. IEEE
|
| 2014 | A* | conf |
DAC
|
| 2014 | A | conf |
ITC
|
| 2014 | — | conf |
MWSCAS
|
| 2014 | A | conf |
ITC
|
| 2013 | C | conf |
IOLTS
|
| 2013 | A | conf |
ICCAD
|
| 2013 | A | conf |
DATE
|
| 2013 | A | conf |
ITC
|
| 2013 | — | conf |
HOST
|
| 2013 | A | conf |
DATE
|
| 2013 | A | conf |
Hardware Trojans in wireless cryptographic ICs: silicon demonstration & detection method evaluation.
ICCAD
|
| 2013 | Misc | conf |
VTS
|
| 2013 | C | conf |
IOLTS
|
| 2013 | J | jnl |
IEEE Trans. Computers
|
| 2013 | B | conf |
ETS
|
| 2013 | J | jnl |
J. Electron. Test.
|
| 2013 | A | conf |
ITC
|
| 2013 | B | conf |
ETS
|
| 2012 | C | conf |
ISCAS
|
| 2012 | J | jnl |
IEEE Des. Test Comput.
|
| 2012 | C | conf |
ICCD
|
| 2012 | J | jnl |
IEEE Trans. Computers
|
| 2012 | A | conf |
ITC
|
| 2012 | — | conf |
DFT
|
| 2012 | A | conf |
DATE
|
| 2012 | Misc | conf |
VTS
|
| 2012 | J | jnl |
IEEE Trans. Inf. Forensics Secur.
|
| 2012 | A | conf |
ICCAD
|
| 2012 | A | conf |
ITC
|
| 2012 | Misc | conf |
VTS
|
| 2012 | A | conf |
ITC
|
| 2011 | B | conf |
ETS
|
| 2011 | A | conf |
DATE
|
| 2011 | — | conf |
HOST
|
| 2011 | Misc | conf |
VTS
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2011 | J | jnl |
IEEE Des. Test Comput.
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2011 | C | conf |
ICCD
|
| 2011 | A | conf |
ICCAD
|
| 2011 | — | conf |
ICECS
|
| 2011 | J | jnl |
IEEE Trans. Computers
|
| 2010 | C | conf |
IOLTS
|
| 2010 | A | conf |
ITC
|
| 2010 | — | conf |
ICECS
|
| 2010 | J | jnl |
IEEE Des. Test Comput.
|
| 2010 | A | conf |
ITC
|
| 2010 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | Misc | conf |
VTS
|
| 2009 | J | jnl |
IEEE Trans. Computers
|
| 2009 | A | conf |
DATE
|
| 2009 | — | conf |
HOST
|
| 2009 | C | conf |
ICCD
|
| 2009 | Misc | conf |
VTS
|
| 2009 | J | jnl |
J. Electron. Test.
|
| 2009 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2009 | Misc | conf |
VTS
|
| 2009 | — | conf |
DFT
|
| 2008 | Misc | conf |
VTS
|
| 2008 | B | conf |
ETS
|
| 2008 | — | conf |
ASYNC
|
| 2008 | — | conf |
DFT
|
| 2008 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2008 | — | conf |
HOST
|
| 2008 | A | conf |
On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors.
ITC
|
| 2008 | C | conf |
IOLTS
|
| 2008 | J | jnl |
IEEE Trans. Reliab.
|
| 2007 | J | jnl |
IEEE Trans. Computers
|
| 2007 | Misc | conf |
VTS
|
| 2007 | J | jnl |
On the identification of modular test requirements for low cost hierarchical test path construction.
Integr.
|
| 2006 | — | conf |
ASYNC
|
| 2006 | J | jnl |
IEEE J. Solid State Circuits
|
| 2006 | A | conf |
DATE
|
| 2006 | Misc | conf |
VTS
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2006 | — | conf |
ASYNC
|
| 2006 | A | conf |
ITC
|
| 2006 | Misc | conf |
VTS
|
| 2006 | A | conf |
ICCAD
|
| 2005 | J | jnl |
Microelectron. J.
|
| 2005 | A | conf |
DATE
|
| 2005 | Misc | conf |
VTS
|
| 2005 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2005 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2005 | — | conf |
ASP-DAC
|
| 2005 | A | conf |
ITC
|
| 2004 | J | jnl |
J. Electron. Test.
|
| 2004 | C | conf |
ICCD
|
| 2004 | — | conf |
ISQED
|
| 2004 | Misc | conf |
VTS
|
| 2004 | J | jnl |
IEEE Trans. Reliab.
|
| 2004 | — | conf |
ACM Great Lakes Symposium on VLSI
|
| 2004 | A | conf |
DATE
|
| 2004 | A | conf |
ITC
|
| 2004 | A | conf |
ICCAD
|
| 2003 | C | conf |
IOLTS
|
| 2003 | Misc | conf |
VTS
|
| 2003 | A | conf |
ITC
|
| 2003 | — | conf |
ISQED
|
| 2003 | C | conf |
Cost-Effective Graceful Degradation in Speculative Processor Subsystems: The Branch Prediction Case.
ICCD
|
| 2003 | — | conf |
DFT
|
| 2003 | C | conf |
ICCD
|
| 2003 | — | conf |
DFT
|
| 2003 | A | conf |
DATE
|
| 2003 | C | conf |
IOLTS
|
| 2003 | Misc | conf |
VLSI Design
|
| 2003 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2002 | — | conf |
DFT
|
| 2002 | J | jnl |
J. Electron. Test.
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2002 | — | conf |
Asian Test Symposium
|
| 2001 | Misc | conf |
VTS
|
| 2000 | — | conf |
LATW
|
| 2000 | — | conf |
Asian Test Symposium
|
| 2000 | — | conf |
ETW
|
| 2000 | Misc | conf |
VTS
|
| 2000 | — | conf |
CICC
|
| 2000 | C | conf |
ISCAS
|
| 1999 | — | conf |
DFT
|
| 1999 | A | conf |
DATE
|
| 1999 | — | conf |
ICECS
|
| 1999 | — | conf |
CICC
|
| 1998 | A | conf |
ITC
|
| 1998 | J | jnl |
J. Electron. Test.
|