Yining Chen

16 papers A* 2A 1Journal 10Unranked 3
YearRankTypeTitle / Venue / Authors
2026 J jnl
A Hybrid Weakly Supervised Approach for enhanced High-Precision SEM Defect Segmentation in Nanoscale Semiconductor Manufacturing.
ACM Trans. Design Autom. Electr. Syst.
Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen, Qi Sun, Cheng Zhuo
2026 J jnl
A survey on semiconductor wafer yield prediction by artificial intelligence.
Microelectron. J.
Dongyan Zhao, Yining Chen, Pang Guo, Fangke Chen, Ruyue Jing, Xin Xu, Yanning Chen, Fang Liu, Bo Wu
2026 J jnl
AMBCT: Adaptive multi-view Bayesian co-training for semi-supervised virtual metrology.
Expert Syst. Appl.
Jiangchen Wu, Fangke Chen, Pang Guo, Yuping Wang, Weiping Xie, Yining Chen, Dawei Gao
2026 — conf
REDM: Regression-Guided Diffusion Modeling for Universal Soft Sensor Enhancement in Semiconductor Process Control.
ASP-DAC
Weiping Xie, Yumeng Shi, Pang Guo, Yining Chen
2025 J jnl
A novel joint segmentation approach for wafer surface defect classification based on blended network structure.
J. Intell. Manuf.
Zhouzhouzhou Mei, Yuening Luo, Yibo Qiao, Yining Chen
2025 — conf
DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture.
ASP-DAC
Lichao Zeng, Zhouzhouzhou Mei, Zhongyu Shi, Yining Chen
2025 A* conf
KARMAD: KAN-Based Adversarial Robust Model for Anomaly Detection.
ICDE
Fangke Chen, Xiaotian Qiu, Yihan Ye, Ruyue Jing, Yining Chen, Dawei Gao
2025 J jnl
SCSNet: a novel transformer-CNN fusion architecture for enhanced segmentation and classification on high-resolution semiconductor micro-scale defects.
Appl. Intell.
Yuening Luo, Zhouzhouzhou Mei, Yibo Qiao, Yining Chen
2025 J jnl
SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image.
CoRR
Qian Jin, Yuqi Jiang, Xudong Lu, Yumeng Liu, Yining Chen, Dawei Gao, Qi Sun, Cheng Zhuo
2025 J jnl
SPPE-GAN: A novel model for Die-to-Database alignment and SEM distortion correction framework.
Expert Syst. Appl.
Yuping Wang, Yining Chen, Jiangchen Wu
2025 J jnl
Yield Diagnosis and Tuning for Emerging Semiconductors During Research Stage.
IEEE Access
Chunshan Wang, Zizhao Ma, Yuxuan Zhu, Chensheng Jin, Dongyu Chen, Chuxin Zhang, Yining Chen, Wenzhong Bao, Yufeng Xie
2024 J jnl
DeepSEM-Net: Enhancing SEM defect analysis in semiconductor manufacturing with a dual-branch CNN-Transformer architecture.
Comput. Ind. Eng.
Yibo Qiao, Zhouzhouzhou Mei, Yuening Luo, Yining Chen
2024 J jnl
Explainable prediction of deposited film thickness in IC fabrication with CatBoost and SHapley Additive exPlanations (SHAP) models.
Appl. Intell.
Yumeng Shi, Yu Cai, Shunyuan Lou, Yining Chen
2024 A* conf
Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation.
DAC
Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen, Qi Sun, Cheng Zhuo
2024 A conf
SEM-CLIP: Precise Few-Shot Learning for Nanoscale Defect Detection in Scanning Electron Microscope Image.
ICCAD
Qian Jin, Yuqi Jiang, Xudong Lu, Yumeng Liu, Yining Chen, Dawei Gao, Qi Sun, Cheng Zhuo
2023 — conf
A Method of Predicting the Deposited Film Thickness in IC Fabrication Based on Stacking Ensemble Learning.
CSAI
Jiangchen Wu, Yumeng Shi, Yining Chen