Yingdi Liu

14 papers A 4Misc 2Journal 8
YearRankTypeTitle / Venue / Authors
2024 Misc conf
X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology.
VLSID
Ashrith S. Harith, Yingdi Liu, Nilanjan Mukherjee, Jeffrey Mayer
2022 J jnl
Two new stenosis detection methods of coronary angiograms.
Int. J. Comput. Assist. Radiol. Surg.
Yaofang Liu, Xinyue Zhang, Wenlong Wan, Shaoyu Liu, Yingdi Liu, Hu Liu, Xueying Zeng, Qing Zhang
2021 J jnl
A Knowledge Image Construction Method for Effective Information Filtering and Mining From Education Big Data.
IEEE Access
Yunfang Xie, Peng Wen, Wenhui Hou, Yingdi Liu
2021 J jnl
Abnormal Behavior Recognition in Classroom Pose Estimation of College Students Based on Spatiotemporal Representation Learning.
Traitement du Signal
Yunfang Xie, Su Zhang, Yingdi Liu
2021 J jnl
Time and Area Optimized Testing of Automotive ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer
2021 J jnl
Two New Stenoses Detection Methods of Coronary Angiograms.
CoRR
Yaofang Liu, Xinyue Zhang, Wenlong Wan, Shaoyu Liu, Yingdi Liu, Hu Liu, Xueying Zeng, Qing Zhang
2021 J jnl
X-Tolerant Compactor maXpress for In-System Test Applications With Observation Scan.
IEEE Trans. Very Large Scale Integr. Syst.
Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wlodarczak
2020 J jnl
Deterministic Stellar BIST for Automotive ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer
2020 A conf
X-Tolerant Tunable Compactor for In-System Test.
ITC
Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Bartosz Wldarczak
2019 A conf
Test Time and Area Optimized BrST Scheme for Automotive ICs.
ITC
Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki
2018 A conf
Deterministic Stellar BIST for In-System Automotive Test.
ITC
Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer
2018 Misc conf
Staggered ATPG with capture-per-cycle observation test points.
VTS
Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer
2017 J jnl
Embedded Deterministic Test Points.
IEEE Trans. Very Large Scale Integr. Syst.
Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada
2016 A conf
Minimal area test points for deterministic patterns.
ITC
Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer