| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2025 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2025 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2024 | J | jnl |
IEEE Trans. Circuits Syst. II Express Briefs
|
| 2024 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2023 | J | jnl |
J. Comput. Sci. Technol.
|
| 2022 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2021 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2020 | A | conf |
DATE
|
| 2020 | J | jnl |
IEEE Access
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2019 | A | conf |
DATE
|
| 2018 | — | conf |
ITC-Asia
|
| 2018 | J | jnl |
J. Electron. Test.
|
| 2017 | — | conf |
VLSI-DAT
|
| 2017 | A | conf |
ITC
|
| 2015 | A | conf |
DATE
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2011 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2010 | — | conf |
Asian Test Symposium
|
| 2009 | J | jnl |
J. Comput. Sci. Technol.
|
| 2008 | Misc | conf |
VTS
|
| 2008 | — | conf |
ATS
|