Yinan N. Shen

18 papers A 1B 2C 2Journal 7Unranked 6
YearRankTypeTitle / Venue / Authors
1997 B conf
On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model.
ICPP
Yinan N. Shen, Xiao-Tao Chen, Susumu Horiguchi, Fabrizio Lombardi
1996 J jnl
A Sweeping Line Approach to Interconnect Testing.
IEEE Trans. Computers
José Salinas, Yinan N. Shen, Fabrizio Lombardi
1996 J jnl
Graph Algorithms for Conformance Testing Using the Rural Chinese Postman Tour.
SIAM J. Discret. Math.
Yinan N. Shen, Fabrizio Lombardi
1996 C conf
Space Cutting Approaches for Repairing Memories.
ICCD
Yinan N. Shen, Nohpill Park, Fabrizio Lombardi
1994 C conf
An Approach for UIO Generation for FSM Verification and Validation.
ISCAS
D. Schin, Yinan N. Shen, Fabrizio Lombardi
1994 — conf
Scheduling Policies for Fault Tolerance in a VLSI Processor.
DFT
Yinan N. Shen, Hannu H. Kari, Sungsoo Kim, Fabrizio Lombardi
1993 J jnl
Fault detection in TFCMOS/DFCMOS combinational gates.
Integr.
Giacomo Buonanno, Fabrizio Lombardi, Donatella Sciuto, Yinan N. Shen
1992 J jnl
Evaluation and improvement of fault coverage of conformance testing by UIO sequences.
IEEE Trans. Commun.
Fabrizio Lombardi, Yinan N. Shen
1992 B conf
On the Verification and Validation of Protocols with High Fault Coverage Using UIO Sequences.
SRDS
Xiao Sun, Yinan N. Shen, Fabrizio Lombardi
1992 J jnl
Protocol conformance testing using multiple UIO sequences.
IEEE Trans. Commun.
Yinan N. Shen, Fabrizio Lombardi, Anton T. Dahbura
1991 — conf
On a new approach for enhancing the fault coverage of conformance testing of protocols.
SPDP
Fabrizio Lombardi, Yinan N. Shen, Hannu H. Kari
1991 — conf
Protocol Conformance Testing by Discriminating UIO Sequences.
PSTV
Xiao Sun, Yinan N. Shen, Fabrizio Lombardi, Donatella Sciuto
1990 — conf
Evaluation and improvement of fault coverage for verification and validation of protocols.
SPDP
Yinan N. Shen, Fabrizio Lombardi, Donatella Sciuto
1990 J jnl
New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Wei-Kang Huang, Yinan N. Shen, Fabrizio Lombardi
1990 — conf
On the testability of array structures for FFT computation.
SPDP
Fabrizio Lombardi, Yinan N. Shen, Jon C. Muzio
1990 J jnl
Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection.
J. Electron. Test.
Yinan N. Shen, Fabrizio Lombardi
1989 A conf
Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield Enhancement.
ITC
Yinan N. Shen, Fabrizio Lombardi
1989 — conf
Protocol Conformance Testing Using Multiple UIO Sequences.
PSTV
Yinan N. Shen, Fabrizio Lombardi, Anton T. Dahbura