Yiming Qu

16 papers Journal 3Unranked 13
YearRankTypeTitle / Venue / Authors
2025 — conf
Observation of Self-heating Process in STT-MRAM and Its Implication in Device Operations.
IRPS
Zhangsheng Lan, Yiming Qu, Shifan Gao, Yi Wei, Yuhao Chen, Wenchao Yan, Ming Wang, Xiaolei Yang, Shikun He, Yi Zhao
2024 — conf
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs.
IRPS
Yiming Qu, Chu Yan, Yaru Ding, Yi Zhao
2024 — conf
Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications.
IRPS
Zeping Weng, Zhangsheng Lan, Yaru Ding, Yiming Qu, Yi Zhao
2024 — conf
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs.
IRPS
Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao
2023 — conf
GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model.
IRPS
Xinwei Yu, Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao
2023 — conf
GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States.
IRPS
Yiming Qu, Chu Yan, Xinwei Yu, Yaru Ding, Yi Zhao
2023 — conf
Interval time dependent wake-up effect of HfZrO ferroelectric capacitor.
IRPS
Yaru Ding, Xinwei Yu, Chu Yan, Zeping Weng, Yiming Qu, Yi Zhao
2023 J jnl
Multimedia teaching resource allocation method for distance online education based on packet cluster mapping.
Int. J. Inf. Commun. Technol.
Yiming Qu, I-Hua Chen, Shangjie Meng
2022 — conf
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress.
IRPS
Yaru Ding, Wei Liu, Yiming Qu, Liang Zhao, Yi Zhao
2022 — conf
GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films.
IRPS
Yiming Qu, Yang Shen, Mingji Su, Jiwu Lu, Yi Zhao
2022 — conf
Universal Hot Carrier Degradation Model under DC and AC Stresses.
IRPS
Chu Yan, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao
2021 J jnl
Nano-scaled transistor reliability characterization at nano-second regime.
Sci. China Inf. Sci.
Ran Cheng, Ying Sun, Yiming Qu, Wei Liu, Fanyu Liu, Jianfeng Gao, Nuo Xu, Bing Chen
2020 — conf
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation.
IRPS
Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao
2019 — conf
Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System.
IRPS
Shifan Gao, Bing Chen, Nuo Xu, Yiming Qu, Yi Zhao
2018 — conf
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs.
IRPS
Yiming Qu, Ran Cheng, Wei Liu, Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao
2018 J jnl
Sub-1 ns characterization methodology for transistor electrical parameter extraction.
Microelectron. Reliab.
Yiming Qu, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao